Tunable s-SNOM for Nanoscale Infrared Optical Measurement of Electronic Properties of Bilayer Graphene.
Journal
ACS photonics
ISSN: 2330-4022
Titre abrégé: ACS Photonics
Pays: United States
ID NLM: 101634366
Informations de publication
Date de publication:
17 Feb 2021
17 Feb 2021
Historique:
received:
16
09
2020
entrez:
25
3
2021
pubmed:
26
3
2021
medline:
26
3
2021
Statut:
ppublish
Résumé
Here we directly probe the electronic properties of bilayer graphene using s-SNOM measurements with a broadly tunable laser source over the energy range from 0.3 to 0.54 eV. We tune an OPO/OPA system around the interband resonance of Bernal stacked bilayer graphene (BLG) and extract amplitude and phase of the scattered light. This enables us to retrieve and reconstruct the complex optical conductivity resonance in BLG around 0.39 eV with nanoscale resolution. Our technique opens the door toward nanoscopic noncontact measurements of the electronic properties in complex hybrid 2D and van der Waals material systems, where scanning tunneling spectroscopy cannot access the decisive layers.
Identifiants
pubmed: 33763503
doi: 10.1021/acsphotonics.0c01442
pmc: PMC7976599
doi:
Types de publication
Journal Article
Langues
eng
Pagination
418-423Informations de copyright
© 2021 American Chemical Society.
Déclaration de conflit d'intérêts
The authors declare the following competing financial interest(s): H. Linnenbank, T. Steinle, and H. Giessen are co-founders of SI Stuttgart Instruments GmbH, a company producing the OPO/OPA laser system such as the one used in this study. The other authors declare no conflict of interests.
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