Single-shot spatial coherence characterization of x-ray ultrafast sources.

Spatial coherence is an impactful source parameter in many applications ranging from atomic and molecular physics to metrology or imaging. In lensless imaging, for example, it can strongly affect the image formation, especially when the source exhibits shot-to-shot variations. Single-shot characterization of the spatial coherence length of a source is thus crucial. However, current techniques require either parallel intensity measurements or the use of several masks. Based on the method proposed by González et al. [J. Opt. Soc. Am. A28, 1107 (2011)JOAOD60740-323210.1364/JOSAA.28.001107], we designed a specific arrangement of a two-dimensional non-redundant array of apertures, which allows, through its far field interference pattern, for a single-shot measurement of the spatial coherence, while being robust against beam-pointing instabilities. The strategic configuration of the pinholes allows us to disentangle the degree of spatial coherence from the intensity distribution, thus removing the need for parallel measurement of the beam intensity. An experimental validation is performed using a high-harmonic source. A statistical study in different regimes shows the robustness of the method.