Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure.
X-ray diffraction
depth-resolved analysis
mosaic crystals
residual stress
Journal
Journal of applied crystallography
ISSN: 0021-8898
Titre abrégé: J Appl Crystallogr
Pays: United States
ID NLM: 9876190
Informations de publication
Date de publication:
01 Feb 2021
01 Feb 2021
Historique:
received:
18
02
2020
accepted:
20
10
2020
entrez:
9
4
2021
pubmed:
10
4
2021
medline:
10
4
2021
Statut:
epublish
Résumé
Two evaluation concepts for nondestructive depth-resolved X-ray residual stress analysis in the near-surface region of materials with cubic symmetry and nearly single crystalline structure are introduced by simulated examples. Both concepts are based on the same data acquisition strategy, which consists in the determination of lattice-spacing depth profiles along the 〈
Identifiants
pubmed: 33833638
doi: 10.1107/S1600576720014016
pii: S1600576720014016
pmc: PMC7941319
doi:
Types de publication
Journal Article
Langues
eng
Pagination
22-31Informations de copyright
© Andreas Hollmann et al. 2021.
Références
Science. 1968 Mar 1;159(3818):973-5
pubmed: 5635993