High In-Plane Thermal Conductivity of Aluminum Nitride Thin Films.
AlN thin films
anisotropy ratio
in-plane thermal conductivity
phonon−phonon scattering
steady-state thermoreflectance
Journal
ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589
Informations de publication
Date de publication:
22 Jun 2021
22 Jun 2021
Historique:
pubmed:
29
4
2021
medline:
29
4
2021
entrez:
28
4
2021
Statut:
ppublish
Résumé
High thermal conductivity materials show promise for thermal mitigation and heat removal in devices. However, shrinking the length scales of these materials often leads to significant reductions in thermal conductivities, thus invalidating their applicability to functional devices. In this work, we report on high in-plane thermal conductivities of 3.05, 3.75, and 6 μm thick aluminum nitride (AlN) films measured
Identifiants
pubmed: 33908771
doi: 10.1021/acsnano.0c09915
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM