X-ray Nanoimaging of Crystal Defects in Single Grains of Solid-State Electrolyte Li

Bragg coherent diffractive imaging LLZO extended crystal defects single grain diffraction solid-state electrolyte

Journal

Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070

Informations de publication

Date de publication:
09 Jun 2021
Historique:
pubmed: 30 4 2021
medline: 30 4 2021
entrez: 29 4 2021
Statut: ppublish

Résumé

All-solid-state lithium batteries promise significant improvements in energy density and safety over traditional liquid electrolyte batteries. The Al-doped Li

Identifiants

DOI: 10.1021/acs.nanolett.1c00315 PMID: 33914547
pubmed: 33914547
doi: 10.1021/acs.nanolett.1c00315
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

4570-4576

Auteurs

Yifei Sun (Y)

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850, United States.
ORCID: 0000-0002-9562-5120

Oleg Gorobstov (O)

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850, United States.
ORCID: 0000-0002-0057-1968

Linqin Mu (L)

Department of Chemistry, Virginia Tech, Blacksburg, Virginia 24061, United States.
ORCID: 0000-0003-4421-4820

Daniel Weinstock (D)

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850, United States.

Ryan Bouck (R)

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850, United States.

Wonsuk Cha (W)

Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, United States.

Nikolaos Bouklas (N)

Sibley School of Mechanical and Aerospace Engineering, Cornell University, Ithaca, New York 14850, United States.

Feng Lin (F)

Department of Chemistry, Virginia Tech, Blacksburg, Virginia 24061, United States.
ORCID: 0000-0002-3729-3148

Andrej Singer (A)

Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14850, United States.
ORCID: 0000-0002-2965-9242

Classifications MeSH