Correction of aberration-induced phase errors in phase measuring deflectometry.


Journal

Optics letters
ISSN: 1539-4794
Titre abrégé: Opt Lett
Pays: United States
ID NLM: 7708433

Informations de publication

Date de publication:
01 May 2021
Historique:
entrez: 30 4 2021
pubmed: 1 5 2021
medline: 1 5 2021
Statut: ppublish

Résumé

Phase measuring deflectometry is a powerful measuring method of complex optical surfaces that captures the reflected fringe images associated with a displaying screen and calculates the normal vectors of the surface under test (SUT) accordingly. The captured images are usually set conjugate to the SUT, which in turn makes the screen defocused. As a result, the blurring effect caused by the defocus and aberrations of the off-axis catadioptric imaging system can severely degrade the phases solved from the blurred images. In order to correct the phase errors, the space-variant point spread functions (PSFs) are modeled using a skew-normal function. The phase bias is estimated by forward convolution between the captured images and the PSF models. Demonstrated with a highly curved aspheric surface, the measurement accuracy can be improved by three times.

Identifiants

pubmed: 33929415
pii: 450242
doi: 10.1364/OL.415953
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

2047-2050

Auteurs

Classifications MeSH