In Situ X-Ray Techniques for Electrochemical Interfaces.
X-ray absorption
electrochemistry
spectroscopy
surface X-ray diffraction
Journal
Annual review of analytical chemistry (Palo Alto, Calif.)
ISSN: 1936-1335
Titre abrégé: Annu Rev Anal Chem (Palo Alto Calif)
Pays: United States
ID NLM: 101508602
Informations de publication
Date de publication:
27 07 2021
27 07 2021
Historique:
aheadofprint:
03
05
2021
pubmed:
5
5
2021
medline:
5
5
2021
entrez:
4
5
2021
Statut:
epublish
Résumé
This article reviews progress in the study of materials using X-ray-based techniques from an electrochemistry perspective. We focus on in situ/in operando surface X-ray scattering, X-ray absorption spectroscopy, and the combination of both methods. The background of these techniques together with key concepts is introduced. Key examples of in situ and in operando investigation of liquid-solid and liquid-liquid interfaces are presented. X-ray scattering and spectroscopy have helped to develop an understanding of the underlying atomic and molecular processes associated with electrocatalysis, electrodeposition, and battery materials. We highlight recent developments, including resonant surface diffraction and time-resolved studies.
Identifiants
pubmed: 33940932
doi: 10.1146/annurev-anchem-091020-100631
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM