Gate-tuned anomalous Hall effect driven by Rashba splitting in intermixed LaAlO


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
21 May 2021
Historique:
received: 04 12 2020
accepted: 28 04 2021
entrez: 22 5 2021
pubmed: 23 5 2021
medline: 23 5 2021
Statut: epublish

Résumé

The Anomalous Hall Effect (AHE) is an important quantity in determining the properties and understanding the behaviour of the two-dimensional electron system forming at the interface of SrTiO

Identifiants

pubmed: 34021190
doi: 10.1038/s41598-021-89767-3
pii: 10.1038/s41598-021-89767-3
pmc: PMC8140084
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

10726

Références

Phys Rev Lett. 2015 Jul 3;115(1):016803
pubmed: 26182114
Phys Rev Lett. 2004 Apr 23;92(16):166601
pubmed: 15169250
Adv Mater. 2018 Dec;30(51):e1805269
pubmed: 30556635
Nature. 2015 Nov 12;527(7577):212-5
pubmed: 26524519
Nat Phys. 2016 May;12(5):484-492
pubmed: 27158255
Proc Natl Acad Sci U S A. 2013 Jun 11;110(24):9633-8
pubmed: 23708121
Rev Sci Instrum. 2017 Dec;88(12):123706
pubmed: 29289200
Phys Rev Lett. 2009 Nov 27;103(22):226802
pubmed: 20366118
Nat Mater. 2016 Dec;15(12):1261-1266
pubmed: 27571452
Phys Rev Lett. 2020 Jan 10;124(1):017702
pubmed: 31976734
Phys Rev Lett. 2017 Mar 10;118(10):106401
pubmed: 28339281
Nat Mater. 2008 Aug;7(8):621-5
pubmed: 18587402
Nano Lett. 2012 Aug 8;12(8):4055-9
pubmed: 22769056
Nano Lett. 2017 Dec 13;17(12):7659-7664
pubmed: 29112444
Nat Commun. 2014 Feb 27;5:3414
pubmed: 24572991
Nat Commun. 2017 Mar 16;8:14777
pubmed: 28300133
Phys Rev Lett. 2010 Mar 26;104(12):126803
pubmed: 20366557
Nat Commun. 2012;3:1129
pubmed: 23072799
Nat Mater. 2007 Jul;6(7):493-6
pubmed: 17546035
Adv Mater. 2018 Jun;30(25):e1706708
pubmed: 29732633
Nat Mater. 2016 Mar;15(3):278-83
pubmed: 26641020
Nat Commun. 2012 Jun 26;3:922
pubmed: 22735450
Phys Rev Lett. 2010 Mar 26;104(12):126802
pubmed: 20366556
Sci Rep. 2014 Oct 27;4:6788
pubmed: 25346028
Phys Rev Lett. 2014 Jan 10;112(1):017205
pubmed: 24483927
Phys Rev Lett. 2006 May 19;96(19):196404
pubmed: 16803118

Auteurs

N Lebedev (N)

Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA, Leiden, The Netherlands.

M Stehno (M)

Physikalisches Institut (EP 3), Universität Würzburg, Am Hubland, 97074, Würzburg, Germany.

A Rana (A)

Center for Advanced Materials and Devices, BML Munjal University (Hero Group), Gurgaon, 122413, India.
MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands.

P Reith (P)

MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands.

N Gauquelin (N)

Electron Microscopy for Materials Science, University of Antwerp, Campus Groenenborger Groenenborgerlaan 171, 2020, Antwerpen, Belgium.

J Verbeeck (J)

Electron Microscopy for Materials Science, University of Antwerp, Campus Groenenborger Groenenborgerlaan 171, 2020, Antwerpen, Belgium.

H Hilgenkamp (H)

MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands.

A Brinkman (A)

MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands.

J Aarts (J)

Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA, Leiden, The Netherlands. aarts@physics.leidenuniv.nl.

Classifications MeSH