Photoacoustic characteristics of carbon-based infrared absorbers.

Candle soot Carbon nanotubes Photoacoustic response

Journal

Photoacoustics
ISSN: 2213-5979
Titre abrégé: Photoacoustics
Pays: Germany
ID NLM: 101622604

Informations de publication

Date de publication:
Sep 2021
Historique:
received: 24 11 2020
revised: 18 03 2021
accepted: 18 03 2021
entrez: 7 6 2021
pubmed: 8 6 2021
medline: 8 6 2021
Statut: epublish

Résumé

We present an experimental comparison of photoacoustic responsivities of common highly absorbing carbon-based materials. The comparison was carried out with parameters relevant for photoacoustic power detectors and Fourier-transform infrared (FTIR) spectroscopy: we covered a broad wavelength range from the visible red to far infrared (633 nm to 25 μm) and the regime of low acoustic frequencies (< 1 kHz). The investigated materials include a candle soot-based coating, a black paint coating and two different carbon nanotube coatings. Of these, the low-cost soot absorber produced clearly the highest photoacoustic response over the entire measurement range.

Identifiants

pubmed: 34094850
doi: 10.1016/j.pacs.2021.100265
pii: S2213-5979(21)00026-4
pmc: PMC8167147
doi:

Types de publication

Journal Article

Langues

eng

Pagination

100265

Informations de copyright

© 2021 The Author(s).

Déclaration de conflit d'intérêts

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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Auteurs

Jussi Rossi (J)

Photonics Laboratory, Physics Unit, Tampere University, Tampere, Finland.

Juho Uotila (J)

Patria Aviation Oy, Tampere, Finland.

Sucheta Sharma (S)

Metrology Research Institute, Aalto University, Espoo, Finland.

Toni Laurila (T)

Metrology Research Institute, Aalto University, Espoo, Finland.

Roland Teissier (R)

IES, University of Montpellier, CNRS, 34095, Montpellier, France.

Alexei Baranov (A)

IES, University of Montpellier, CNRS, 34095, Montpellier, France.

Erkki Ikonen (E)

Metrology Research Institute, Aalto University, Espoo, Finland.
VTT MIKES, Espoo, Finland.

Markku Vainio (M)

Photonics Laboratory, Physics Unit, Tampere University, Tampere, Finland.
Department of Chemistry, University of Helsinki, Helsinki, Finland.

Classifications MeSH