Ion track etching of polycarbonate membranes monitored by


Journal

Physical chemistry chemical physics : PCCP
ISSN: 1463-9084
Titre abrégé: Phys Chem Chem Phys
Pays: England
ID NLM: 100888160

Informations de publication

Date de publication:
07 Jul 2021
Historique:
pubmed: 24 6 2021
medline: 24 6 2021
entrez: 23 6 2021
Statut: ppublish

Résumé

In situ small angle X-ray scattering (SAXS) measurements of ion track etching in polycarbonate foils are used to directly monitor the selective dissolution of ion tracks with high precision, including the early stages of etching. Detailed information about the track etching kinetics and size, shape, and size distribution of an ensemble of nanopores is obtained. Time resolved measurements as a function of temperature and etchant concentration show that the pore radius increases almost linearly with time for all conditions and the etching process can be described by an Arrhenius law. The radial etching shows a power law dependency on the etchant concentration. An increase in the etch rate with increasing temperature or concentration of the etchant reduces the penetration of the etchant into the polymer but does not affect the pore size distribution. The in situ measurements provide an estimate for the track etch rate, which is found to be approximately three orders of magnitude higher than the radial etch rate. The measurement methodology enables new experiments studying membrane fabrication and performance in liquid environments.

Identifiants

pubmed: 34159988
doi: 10.1039/d1cp02063c
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

14231-14241

Auteurs

Alexander Kiy (A)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Christian Notthoff (C)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Shankar Dutt (S)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Mark Grigg (M)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Andrea Hadley (A)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Pablo Mota-Santiago (P)

Australian Synchrotron, ANSTO, 800 Blackburn Rd, Clayton VIC 3168, Australia.

Nigel Kirby (N)

Australian Synchrotron, ANSTO, 800 Blackburn Rd, Clayton VIC 3168, Australia.

Christina Trautmann (C)

GSI Helmholtzzentrum für Schwerionenforschung, Planckstr. 1, 64291 Darmstadt, Germany and Technische Universität Darmstadt, 64289 Darmstadt, Germany.

Maria E Toimil-Molares (ME)

Technische Universität Darmstadt, 64289 Darmstadt, Germany.

Patrick Kluth (P)

Department of Electronic Materials Engineering, Research School of Physics, Australian National University, Canberra ACT 2601, Australia. alexander.kiy@anu.edu.au.

Classifications MeSH