Numerical Evaluation on Residual Thermal Stress-Induced Delamination at PDMS-Metal Interface of Neural Prostheses.
adhesion
delamination
neural electrodes
neural implant
polydimethylsiloxane-PDMS
residual stresses
shrinkage
Journal
Micromachines
ISSN: 2072-666X
Titre abrégé: Micromachines (Basel)
Pays: Switzerland
ID NLM: 101640903
Informations de publication
Date de publication:
08 Jun 2021
08 Jun 2021
Historique:
received:
20
05
2021
revised:
01
06
2021
accepted:
04
06
2021
entrez:
2
7
2021
pubmed:
3
7
2021
medline:
3
7
2021
Statut:
epublish
Résumé
The most common failure mode of implantable neural implants has been delamination of layers in compound structures and encapsulations in a wet body environment. Current knowledge of failure mechanisms of adhesion and its standardized test procedures are lacking and must be established. This study demonstrated a combined experimental and numerical method to investigate the residual stresses from one of the most common encapsulation materials, silicone rubber (polydimethylsiloxane-PDMS) during the coating process at elevated temperatures. Measured shrinkage of test specimen correlates well to a modified shrinkage model using thermal-mechanical finite element method (FEM) simulation. All simulated interfacial stresses show stress concentration at the PDMS coating front depending on curing temperature and coating thickness, while Griffith's condition estimated the delamination of the coating front. This study emphasizes the understanding of the interfacial delamination giving the possibility to predict failure mode of neural interface.
Identifiants
pubmed: 34201129
pii: mi12060669
doi: 10.3390/mi12060669
pmc: PMC8226984
pii:
doi:
Types de publication
Journal Article
Langues
eng
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