Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic.
Journal
The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571
Informations de publication
Date de publication:
01 Jun 2021
01 Jun 2021
Historique:
entrez:
10
7
2021
pubmed:
11
7
2021
medline:
11
7
2021
Statut:
ppublish
Résumé
Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10-150 J, 8-30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >10
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM