Spherulitic and rotational crystal growth of Quartz thin films.
Journal
Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288
Informations de publication
Date de publication:
21 Jul 2021
21 Jul 2021
Historique:
received:
03
05
2021
accepted:
30
06
2021
entrez:
22
7
2021
pubmed:
23
7
2021
medline:
23
7
2021
Statut:
epublish
Résumé
To obtain crystalline thin films of alpha-Quartz represents a challenge due to the tendency for the material towards spherulitic growth. Thus, understanding the mechanisms that give rise to spherulitic growth can help regulate the growth process. Here the spherulitic type of 2D crystal growth in thin amorphous Quartz films was analyzed by electron back-scatter diffraction (EBSD). EBSD was used to measure the size, orientation, and rotation of crystallographic grains in polycrystalline SiO
Identifiants
pubmed: 34290282
doi: 10.1038/s41598-021-94147-y
pii: 10.1038/s41598-021-94147-y
pmc: PMC8295350
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
14888Subventions
Organisme : Nederlandse Organisatie voor Wetenschappelijk Onderzoek
ID : TOP-260 PUNT Grant No. 718.016002
Informations de copyright
© 2021. The Author(s).
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