MoS

MoS2 photodetector graphene line-scanning imaging near-infrared strain engineering

Journal

ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589

Informations de publication

Date de publication:
24 Aug 2021
Historique:
pubmed: 23 7 2021
medline: 23 7 2021
entrez: 22 7 2021
Statut: ppublish

Résumé

MoS

Identifiants

pubmed: 34291913
doi: 10.1021/acsnano.1c04678
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

12836-12846

Auteurs

Kean You Thai (KY)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

InJun Park (I)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Beom Jin Kim (BJ)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Anh Tuan Hoang (AT)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Yoondeok Na (Y)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Chul Un Park (CU)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Youngcheol Chae (Y)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Jong-Hyun Ahn (JH)

School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, Republic of Korea.

Classifications MeSH