Illuminating Invisible Grain Boundaries in Coalesced Single-Orientation WS
ReaxFF molecular dynamics
chemical vapor deposition
grain boundaries
transition metal dichalcogenides
transmission electron microscopy
tungsten disulfide
Journal
Nano letters
ISSN: 1530-6992
Titre abrégé: Nano Lett
Pays: United States
ID NLM: 101088070
Informations de publication
Date de publication:
11 Aug 2021
11 Aug 2021
Historique:
pubmed:
28
7
2021
medline:
28
7
2021
entrez:
27
7
2021
Statut:
ppublish
Résumé
Engineering atomic-scale defects is crucial for realizing wafer-scale, single-crystalline transition metal dichalcogenide monolayers for electronic devices. However, connecting atomic-scale defects to larger morphologies poses a significant challenge. Using electron microscopy and ReaxFF reactive force field-based molecular dynamics simulations, we provide insights into WS
Identifiants
pubmed: 34314181
doi: 10.1021/acs.nanolett.1c01517
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM