Deep learning-based statistical noise reduction for multidimensional spectral data.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Jul 2021
Historique:
entrez: 3 8 2021
pubmed: 4 8 2021
medline: 4 8 2021
Statut: ppublish

Résumé

In spectroscopic experiments, data acquisition in multi-dimensional phase space may require long acquisition time, owing to the large phase space volume to be covered. In such a case, the limited time available for data acquisition can be a serious constraint for experiments in which multidimensional spectral data are acquired. Here, taking angle-resolved photoemission spectroscopy (ARPES) as an example, we demonstrate a denoising method that utilizes deep learning as an intelligent way to overcome the constraint. With readily available ARPES data and random generation of training datasets, we successfully trained the denoising neural network without overfitting. The denoising neural network can remove the noise in the data while preserving its intrinsic information. We show that the denoising neural network allows us to perform a similar level of second-derivative and line shape analysis on data taken with two orders of magnitude less acquisition time. The importance of our method lies in its applicability to any multidimensional spectral data that are susceptible to statistical noise.

Identifiants

pubmed: 34340442
doi: 10.1063/5.0054920
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

073901

Auteurs

Younsik Kim (Y)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Dongjin Oh (D)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Soonsang Huh (S)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Dongjoon Song (D)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Sunbeom Jeong (S)

Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, South Korea.

Junyoung Kwon (J)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Minsoo Kim (M)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Donghan Kim (D)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Hanyoung Ryu (H)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Jongkeun Jung (J)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Wonshik Kyung (W)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Byungmin Sohn (B)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Suyoung Lee (S)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Jounghoon Hyun (J)

Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, South Korea.

Yeonghoon Lee (Y)

Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, South Korea.

Yeongkwan Kim (Y)

Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, South Korea.

Changyoung Kim (C)

Center for Correlated Electron Systems, Institute for Basic Science, Seoul 08826, South Korea.

Classifications MeSH