Monitoring Electrical Biasing of Pb(Zr

PZT differential phase contrast electrical biasing ferroelectric in situ TEM thin film capacitor

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
23 Aug 2021
Historique:
received: 22 07 2021
revised: 18 08 2021
accepted: 19 08 2021
entrez: 27 8 2021
pubmed: 28 8 2021
medline: 28 8 2021
Statut: epublish

Résumé

Increased data storage densities are required for the next generation of nonvolatile random access memories and data storage devices based on ferroelectric materials. Yet, with intensified miniaturization, these devices face a loss of their ferroelectric properties. Therefore, a full microscopic understanding of the impact of the nanoscale defects on the ferroelectric switching dynamics is crucial. However, collecting real-time data at the atomic and nanoscale remains very challenging. In this work, we explore the ferroelectric response of a Pb(Zr

Identifiants

pubmed: 34443272
pii: ma14164749
doi: 10.3390/ma14164749
pmc: PMC8400982
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
ID : 175926
Organisme : Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung
ID : 200021-188414

Références

Adv Struct Chem Imaging. 2017;3(1):9
pubmed: 28251043
Adv Mater. 2011 Dec 1;23(45):5377-82
pubmed: 21956256
Nat Mater. 2019 Mar;18(3):203-212
pubmed: 30783227
Adv Mater. 2020 Dec;32(49):e2005431
pubmed: 33150671
Adv Mater. 2012 Feb 21;24(8):1106-10
pubmed: 22331626
Phys Rev Lett. 2002 Aug 26;89(9):097601
pubmed: 12190438
Science. 2021 Mar 5;371(6533):1050-1056
pubmed: 33674493
Nat Commun. 2014 Aug 18;5:4693
pubmed: 25131416
J Phys Condens Matter. 2018 May 31;30(21):215701
pubmed: 29633959
Science. 2015 May 1;348(6234):547-51
pubmed: 25883317
Nat Mater. 2003 Jan;2(1):43-7
pubmed: 12652672
Nano Lett. 2011 May 11;11(5):1906-12
pubmed: 21486089
Nat Commun. 2017 Nov 10;8(1):1419
pubmed: 29127282
Adv Mater. 2017 Feb;29(7):
pubmed: 27936292
Science. 2005 Jul 15;309(5733):391-2
pubmed: 16020720
Nat Mater. 2017 Jun;16(6):622-627
pubmed: 28319611
Ultramicroscopy. 2016 Jan;160:265-280
pubmed: 26590505
Nat Commun. 2016 Apr 19;7:11318
pubmed: 27090766
ACS Appl Mater Interfaces. 2017 Aug 2;9(30):25578-25586
pubmed: 28677952
Nat Commun. 2014 May 02;5:3801
pubmed: 24787035
Phys Rev Lett. 2000 Jun 5;84(23):5423-6
pubmed: 10990959
Nanoscale. 2020 Apr 30;12(16):9186-9193
pubmed: 32297890
Nano Lett. 2019 Aug 14;19(8):5319-5326
pubmed: 31268341
Nat Commun. 2011 Dec 20;2:591
pubmed: 22186887

Auteurs

Alexander Vogel (A)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Material Science and Technology, 8600 Dübendorf, Switzerland.

Martin F Sarott (MF)

Department of Materials, Eidgenössische Technische Hochschule Zürich, 8093 Zürich, Switzerland.

Marco Campanini (M)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Material Science and Technology, 8600 Dübendorf, Switzerland.

Morgan Trassin (M)

Department of Materials, Eidgenössische Technische Hochschule Zürich, 8093 Zürich, Switzerland.

Marta D Rossell (MD)

Electron Microscopy Center, Empa, Swiss Federal Laboratories for Material Science and Technology, 8600 Dübendorf, Switzerland.

Classifications MeSH