Multimode Operation of Organic-Inorganic Hybrid Thin-Film Transistors Based on Solution-Processed Indium Oxide Films.

metal oxide semiconductor organic−inorganic hybrid solution process thin-film transistors threshold voltage control

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
15 Sep 2021
Historique:
pubmed: 4 9 2021
medline: 4 9 2021
entrez: 3 9 2021
Statut: ppublish

Résumé

Solution-processed metal oxide (MO) thin films have been extensively studied for use in thin-film transistors (TFTs) due to their high optical transparency, simplicity of fabrication methods, and high electron mobility. Here, we report, for the first time, the improvement of the electronic properties of solution-processed indium oxide (InO

Identifiants

DOI: 10.1021/acsami.1c10982 PMID: 34478260
pubmed: 34478260
doi: 10.1021/acsami.1c10982
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

43051-43062

Auteurs

Tianyu Tang (T)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.

Jakob Zessin (J)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.

Felix Talnack (F)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.

Katherina Haase (K)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.

Katrin Ortstein (K)

Dresden Integrated Center for Applied Physics and Photonic Materials (IAPP) and Institute for Applied Physics, Technische Universität Dresden,Dresden 01062, Germany.

Baiqiang Li (B)

Markus Löffler (M)

Dresden Center for Nanoanalysis (DCN), Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, Dresden 01069, Germany.

Bernd Rellinghaus (B)

Dresden Center for Nanoanalysis (DCN), Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, Dresden 01069, Germany.

Mike Hambsch (M)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.
ORCID: 0000-0002-8487-0972

Stefan C B Mannsfeld (SCB)

Center for Advancing Electronics Dresden (cfaed) and Faculty of Electrical and Computer Engineering, Technische Universität Dresden, Dresden 01062, Germany.
ORCID: 0000-0003-0268-519X

Classifications MeSH