Heterogeneous Functional Dielectric Patterns for Charge-Carrier Modulation in Ultraflexible Organic Integrated Circuits.

charge-carrier modulation flexible electronics functional dielectric patterns integrated circuits organic transistors polymer dielectrics threshold voltage control

Journal

Advanced materials (Deerfield Beach, Fla.)
ISSN: 1521-4095
Titre abrégé: Adv Mater
Pays: Germany
ID NLM: 9885358

Informations de publication

Date de publication:
Nov 2021
Historique:
revised: 11 08 2021
received: 10 06 2021
pubmed: 22 9 2021
medline: 22 9 2021
entrez: 21 9 2021
Statut: ppublish

Résumé

Flexible electronics have gained considerable attention for application in wearable devices. Organic transistors are potential candidates to develop flexible integrated circuits (ICs). A primary technique for maximizing their reliability, gain, and operation speed is the modulation of charge-carrier behavior in the respective transistors fabricated on the same substrate. In this work, heterogeneous functional dielectric patterns (HFDP) of ultrathin polymer gate dielectrics of poly((±)endo,exo-bicyclo[2.2.1]hept-ene-2,3-dicarboxylic acid, diphenylester) (PNDPE) are introduced. The HFDP that are obtained via the photo-Fries rearrangement by ultraviolet radiation in the homogeneous PNDPE provide a functional area for charge-carrier modulation. This leads to programmable threshold voltage control over a wide range (-1.5 to +0.2 V) in the transistors with a high patterning resolution, at 2 V operational voltage. The transistors also exhibit high operational stability over 140 days and under the bias-stress duration of 1800 s. With the HFDP, the performance metrics of ICs, for example, the noise margin and gain of the zero-V

Identifiants

pubmed: 34545628
doi: 10.1002/adma.202104446
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

e2104446

Subventions

Organisme : Ministry of Education, Culture, Sports, Science and Technology
ID : JPMXP09F20OS0045
Organisme : Ministry of Education, Culture, Sports, Science and Technology
ID : JPMXP09S20OS0019
Organisme : Advanced Photonics and Biosensing Open Innovation Laboratory
Organisme : National Institute of Advanced Industrial Science and Technology
Organisme : Japan Science and Technology Agency
ID : JPMJFR2035
Organisme : Japan Science and Technology Agency
ID : JPMJFR2022
Organisme : Japan Society for the Promotion of Science
ID : 19H01174
Organisme : Japan Society for the Promotion of Science
ID : 20K21003
Organisme : Japan Society for the Promotion of Science
ID : 18H01861
Organisme : Japan Society for the Promotion of Science
ID : 19H02199

Informations de copyright

© 2021 The Authors. Advanced Materials published by Wiley-VCH GmbH.

Références

W. Gao, S. Emaminejad, H. Y. Y. Nyein, S. Challa, K. Chen, A. Peck, H. M. Fahad, H. Ota, H. Shiraki, D. Kiriya, D. H. Lien, G. A. Brooks, R. W. Davis, A. Javey, Nature 2016, 529, 509.
G. Schwartz, B. C. K. Tee, J. Mei, A. L. Appleton, D. H. Kim, H. Wang, Z. Bao, Nat. Commun. 2013, 4, 1859.
T. A. Ali, J. Groten, J. Clade, D. Collin, P. Schaffner, M. Zirkl, A. M. Coclite, G. Domann, B. Stadlober, ACS Appl. Mater. Interfaces 2020, 12, 38614.
H. Yao, W. Yang, W. Cheng, Y. J. Tan, H. H. See, S. Li, H. P. A. Ali, B. Z. H. Lim, Z. Liu, B. C. K. Tee, Proc. Natl. Acad. Sci. USA 2020, 117, 25352.
H. Yao, T. Sun, J. S. Chiam, M. Tan, K. Y. Ho, Z. Liu, B. C. K. Tee, Adv. Funct. Mater. 2021, 2008650, https://doi.org/10.1002/adfm.202008650.
S. P. Lacour, G. Courtine, J. Guck, Nat. Rev. Mater. 2016, 1, 16063.
S. Xu, Y. Zhang, L. Jia, K. E. Mathewson, K. I. Jang, J. Kim, H. Fu, X. Huang, P. Chava, R. Wang, S. Bhole, L. Wang, Y. J. Na, Y. Guan, M. Flavin, Z. Han, Y. Huang, J. A. Rogers, Science 2014, 344, 70.
H. Lee, Y. J. Hong, S. Baik, T. Hyeon, D. H. Kim, Adv. Healthcare Mater. 2018, 7, 1701150.
Z. Niu, L. Zhang, L. Liu, B. Zhu, H. Dong, X. Chen, Adv. Mater. 2013, 25, 4035.
K. Qian, R. Y. Tay, M. F. Lin, J. Chen, H. Li, J. Lin, J. Wang, G. Cai, V. C. Nguyen, E. H. T. Teo, T. Chen, P. S. Lee, ACS Nano 2017, 11, 1712.
A. Petritz, A. Wolfberger, A. Fian, T. Griesser, M. Irimia-Vladu, B. Stadlober, Adv. Mater. 2015, 27, 7645.
J. Xu, X. Zhao, Z. Wang, H. Xu, J. Hu, J. Ma, Y. Liu, Small 2019, 15, 1803970.
M. Kaltenbrunner, G. Kettlgruber, C. Siket, R. Schwödiauer, S. Bauer, Adv. Mater. 2010, 22, 2065.
A. Hirsch, H. O. Michaud, A. P. Gerratt, S. de Mulatier, S. P. Lacour, Adv. Mater. 2016, 28, 4507.
M. S. White, M. Kaltenbrunner, E. D. Głowacki, K. Gutnichenko, G. Kettlgruber, I. Graz, S. Aazou, C. Ulbricht, D. A. M. Egbe, M. C. Miron, Z. Major, M. C. Scharber, T. Sekitani, T. Someya, S. Bauer, N. S. Sariciftci, Nat. Photonics 2013, 7, 811.
H. Gold, A. Petritz, E. Karner-Petritz, A. Tschepp, J. Groten, C. Prietl, G. Scheipl, M. Zirkl, B. Stadlober, Phys. Status Solidi RRL 2019, 13, 1900277.
T. Sekitani, T. Yokota, K. Kuribara, M. Kaltenbrunner, T. Fukushima, Y. Inoue, M. Sekino, T. Isoyama, Y. Abe, H. Onodera, T. Someya, Nat. Commun. 2016, 7, 11425.
M. Sugiyama, T. Uemura, M. Kondo, M. Akiyama, N. Namba, S. Yoshimoto, Y. Noda, T. Araki, T. Sekitani, Nat. Electron. 2019, 2, 351.
K. Myny, M. J. Beenhakkers, N. A. J. M. Van Aerle, G. H. Gelinck, J. Genoe, W. Dehaene, P. Heremans, IEEE J. Solid-State Circuits 2011, 46, 1223.
K. Hizu, T. Sekitani, T. Someya, J. Otsuki, Appl. Phys. Lett. 2007, 90, 093504.
U. Zschieschang, F. Ante, M. Schlörholz, M. Schmidt, K. Kern, H. Klauk, Adv. Mater. 2010, 22, 4489.
S. Kobayashi, T. Nishikawa, T. Takenobu, S. Mori, T. Shimoda, T. Mitani, H. Shimotani, N. Yoshimoto, S. Ogawa, Y. Iwasa, Nat. Mater. 2004, 3, 317.
U. Zschieschang, V. P. Bader, H. Klauk, Org. Electron. 2017, 49, 179.
K. Fukuda, T. Sekitani, U. Zschieschang, H. Klauk, K. Kuribara, T. Yokota, T. Sugino, K. Asaka, M. Ikeda, H. Kuwabara, T. Yamamoto, K. Takimiya, T. Fukushima, T. Aida, M. Takamiya, T. Sakurai, T. Someya, Adv. Funct. Mater. 2011, 21, 4019.
A. Kitani, Y. Kimura, M. Kitamura, Y. Arakawa, Jpn. J. Appl. Phys. 2016, 55, 03DC03.
R. Shiwaku, Y. Yoshimura, Y. Takeda, K. Fukuda, D. Kumaki, S. Tokito, Appl. Phys. Lett. 2015, 106, 053301.
I. Lashkov, K. Krechan, K. Ortstein, F. Talnack, S. J. Wang, S. C. B. Mannsfeld, H. Kleemann, K. Leo, ACS Appl. Mater. Interfaces 2021, 13, 8664.
H. Wang, P. Wei, Y. Li, J. Han, H. R. Lee, B. D. Naab, N. Liu, C. Wang, E. Adijanto, B. C. K. Tee, S. Morishita, Q. Li, Y. Gao, Y. Cui, Z. Bao, Proc. Natl. Acad. Sci. USA 2014, 111, 4776.
K. Nakayama, Y. Hirose, J. Soeda, M. Yoshizumi, T. Uemura, M. Uno, W. Li, M. J. Kang, M. Yamagishi, Y. Okada, E. Miyazaki, Y. Nakazawa, A. Nakao, K. Takimiya, J. Takeya, Adv. Mater. 2011, 23, 1626.
H. Klauk, M. Halik, U. Zschieschang, G. Schmid, W. Radlik, W. Weber, J. Appl. Phys. 2002, 92, 5259.
T. Uemura, Y. Hirose, M. Uno, K. Takimiya, J. Takeya, Appl. Phys. Express 2009, 2, 111501.
U. Zschieschang, F. Ante, T. Yamamoto, K. Takimiya, H. Kuwabara, M. Ikeda, T. Sekitani, T. Someya, K. Kern, H. Klauk, Adv. Mater. 2010, 22, 982.
U. Kraft, J. E. Anthony, E. Ripaud, M. A. Loth, E. Weber, H. Klauk, Chem. Mater. 2015, 27, 998.
G. S. May, C. J. Spanos, Fundamentals of Semiconductor Manufacturing and Process Control, Wiley-IEEE, New York 2006.
M. Marchl, M. Edler, A. Haase, A. Fian, G. Trimmel, T. Griesser, B. Stadlober, E. Zojer, Adv. Mater. 2010, 22, 5361.
T. T. Dao, H. Sakai, H. T. Nguyen, K. Ohkubo, S. Fukuzumi, H. Murata, ACS Appl. Mater. Interfaces 2016, 8, 18249.
A. Petritz, A. Wolfberger, A. Fian, J. R. Krenn, T. Griesser, B. Stadlober, Org. Electron. 2013, 14, 3070.
A. M. Ramil, G. Hernandez-Sosa, T. Griesser, C. Simbrunner, T. Höfler, G. Trimmel, W. Kern, Q. Shen, C. Teichert, G. Schwabegger, H. Sitter, N. S. Sariciftci, Appl. Phys. A 2012, 107, 985.
G. Hernandez-Sosa, C. Simbrunner, T. Höfler, A. Moser, O. Werzer, B. Kunert, G. Trimmel, W. Kern, R. Resel, H. Sitter, Org. Electron. 2009, 10, 326.
W. Gu, D. J. Abdallah, R. G. Weiss, J. Photochem. Photobiol., A 2001, 139, 79.
T. Griesser, T. Höfler, S. Temmel, W. Kern, G. Trimmel, Chem. Mater. 2007, 19, 3011.
T. Höfler, T. Grießer, X. Gstrein, G. Trimmel, G. Jakopic, W. Kern, Polymer 2007, 48, 1930.
A. Takemoto, T. Araki, T. Uemura, Y. Noda, S. Yoshimoto, S. Izumi, S. Tsuruta, T. Sekitani, Adv. Intell. Syst. 2020, 2, 2000093.
G. Gelinck, P. Heremans, K. Nomoto, T. D. Anthopoulos, Adv. Mater. 2010, 22, 3778.
S. J. Kim, J. S. Lee, Nano Lett. 2010, 10, 2884.
K. Fukuda, T. Suzuki, D. Kumaki, S. Tokito, Phys. Status Solidi A 2012, 209, 2073.
S. Scheinert, G. Paasch, M. Schrödner, H. K. Roth, S. Sensfuß, T. Doll, J. Appl. Phys. 2002, 92, 330.
J. A. Merlo, C. D. Frisbie, J. Phys. Chem. B 2004, 108, 19169.
A. R. Völkel, R. A. Street, D. Knipp, Phys. Rev. B 2002, 66, 195336.
S. Scheinert, K. P. Pernstich, B. Batlogg, G. Paasch, J. Appl. Phys. 2007, 102, 104503.
M. Kawamura, Y. Nakahara, M. Ohse, M. Kumei, K. Uno, H. Sakamoto, K. Kimura, I. Tanaka, Appl. Phys. Lett. 2012, 101, 053311.
S. E. Fritz, T. W. Kelley, C. D. Frisbie, J. Phys. Chem. B 2005, 109, 10574.
M. Geiger, R. Acharya, E. Reutter, T. Ferschke, U. Zschieschang, J. Weis, J. Pflaum, H. Klauk, R. T. Weitz, Adv. Mater. Interfaces 2020, 7, 1902145.
T. Sekitani, S. Iba, Y. Kato, Y. Noguchi, T. Someya, T. Sakurai, Appl. Phys. Lett. 2005, 87, 173502.
M. Kaltenbrunner, T. Sekitani, J. Reeder, T. Yokota, K. Kuribara, T. Tokuhara, M. Drack, R. Schwödiauer, I. Graz, S. Bauer-Gogonea, S. Bauer, T. Someya, Nature 2013, 499, 458.
M. Kondo, M. Melzer, D. Karnaushenko, T. Uemura, S. Yoshimoto, M. Akiyama, Y. Noda, T. Araki, O. G. Schmidt, T. Sekitani, Sci. Adv. 2020, 6, eaay6094.
S. De Vusser, J. Genoe, P. Heremans, IEEE Trans. Electron Devices 2006, 53, 601.
J. S. Yuan, L. Yang, IEEE Trans. Educ. 2005, 48, 162.
Y. Xu, H. Sun, A. Liu, H. Zhu, B. Li, T. Minari, F. Balestra, G. Ghibaudo, Y. Y. Noh, Adv. Funct. Mater. 2018, 28, 1803907.
G. Fortunato, D. B. Meakin, P. Migliorato, P. G. Le Comber, Philos. Mag. B 1988, 57, 573.
W. L. Kalb, B. Batlogg, Phys. Rev. B 2010, 81, 035327.

Auteurs

Koki Taguchi (K)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Takafumi Uemura (T)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Naoko Namba (N)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Andreas Petritz (A)

JOANNEUM RESEARCH Forschungsgesellschaft mbH, MATERIALS-Institute for Surface Technologies and Photonics, Franz-Pichler-Straße 30, Weiz, 8160, Austria.

Teppei Araki (T)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Masahiro Sugiyama (M)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Barbara Stadlober (B)

JOANNEUM RESEARCH Forschungsgesellschaft mbH, MATERIALS-Institute for Surface Technologies and Photonics, Franz-Pichler-Straße 30, Weiz, 8160, Austria.

Tsuyoshi Sekitani (T)

SANKEN (The Institute of Scientific and Industrial Research), Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka, 567-0047, Japan.
Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.
Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka, 565-0871, Japan.

Classifications MeSH