Nanoscale analysis of superconducting Fe(Se,Te) epitaxial thin films and relationship with pinning properties.
Journal
Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288
Informations de publication
Date de publication:
11 Oct 2021
11 Oct 2021
Historique:
received:
10
06
2021
accepted:
28
09
2021
entrez:
12
10
2021
pubmed:
13
10
2021
medline:
13
10
2021
Statut:
epublish
Résumé
The process of developing superconducting materials for large scale applications is mainly oriented to optimize flux pinning and the current carrying capability. A powerful approach to investigate pinning properties is to combine high resolution imaging with transport measurements as a function of the magnetic field orientation, supported by a pinning modelling. We carry out Transmission Electron Microscopy, Electron Energy Loss Spectroscopy and critical current measurements in fields up to 16 T varying the angle between the field and c-axis of Fe(Se,Te) epitaxial thin films deposited on CaF
Identifiants
pubmed: 34635712
doi: 10.1038/s41598-021-99574-5
pii: 10.1038/s41598-021-99574-5
pmc: PMC8505440
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
20100Subventions
Organisme : PON Beyond-Nano
ID : a3_00363
Organisme : PRIN 'HiBiSCUS'
ID : 201785KWLE
Organisme : PON Nafassy
ID : a3_00007
Informations de copyright
© 2021. The Author(s).
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