Anti-Counterfeiting White Light Printed Image Multiplexing by Fast Nanosecond Laser Processing.

laser processing metasurfaces nanophotonics security printing

Journal

Advanced materials (Deerfield Beach, Fla.)
ISSN: 1521-4095
Titre abrégé: Adv Mater
Pays: Germany
ID NLM: 9885358

Informations de publication

Date de publication:
Jan 2022
Historique:
revised: 14 08 2021
received: 28 05 2021
pubmed: 15 10 2021
medline: 15 10 2021
entrez: 14 10 2021
Statut: ppublish

Résumé

Passive plasmonic metasurfaces enable image multiplexing by displaying different images when altering the conditions of observation. Under white light, three-image multiplexing with polarization-selective switching has been recently demonstrated using femtosecond-laser-processed random plasmonic metasurfaces. Here, the implementation of image multiplexing is extended, thanks to a color-search algorithm, to various observation modes compatible with naked-eye observation under incoherent white light and to four-image multiplexing under polarized light. The laser-processed random plasmonic metasurfaces enabling image multiplexing exhibit self-organized patterns that can diffract light or induce dichroism through hybridization between the localized surface plasmon resonance of metallic nanoparticles and a lattice resonance. Improved spatial resolution makes the image quality compatible with commercial use in secured documents as well as the processing time and cost thanks to the use of a nanosecond laser. This high-speed and flexible laser process, based on energy-efficient nanoparticle reshaping and self-organization, produces centimeter-scale customized tamper-proof images at low cost, which can serve as overt security features.

Identifiants

pubmed: 34648203
doi: 10.1002/adma.202104054
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

e2104054

Subventions

Organisme : Agence Nationale de la Recherche project MIXUP
ID : ANR-18-CE39-0010
Organisme : HID Global CID

Informations de copyright

© 2021 Wiley-VCH GmbH.

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Auteurs

Nicolas Dalloz (N)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.
HID Global CID SAS, 33 rue de Verdun, Suresnes, 92100, France.

Van Doan Le (VD)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Mathieu Hebert (M)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Balint Eles (B)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Manuel A Flores Figueroa (MA)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Christophe Hubert (C)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Hongfeng Ma (H)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Nipun Sharma (N)

HID Global CID SAS, 33 rue de Verdun, Suresnes, 92100, France.

Francis Vocanson (F)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Stéphane Ayala (S)

HID Global Switzerland SA, Z.I., Rte Pra-Charbon 27, Granges, FR 1614, Switzerland.

Nathalie Destouches (N)

Laboratoire Hubert Curien UMR 5516, Univ Lyon, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, 18 rue Professeur Benoît Lauras, Saint-Etienne, 42000, France.

Classifications MeSH