Data reduction for serial crystallography using a robust peak finder.

Bragg peak finding data reduction robust statistics serial crystallography

Journal

Journal of applied crystallography
ISSN: 0021-8898
Titre abrégé: J Appl Crystallogr
Pays: United States
ID NLM: 9876190

Informations de publication

Date de publication:
01 Oct 2021
Historique:
received: 16 03 2021
accepted: 14 07 2021
entrez: 20 10 2021
pubmed: 21 10 2021
medline: 21 10 2021
Statut: epublish

Résumé

A peak-finding algorithm for serial crystallography (SX) data analysis based on the principle of 'robust statistics' has been developed. Methods which are statistically robust are generally more insensitive to any departures from model assumptions and are particularly effective when analysing mixtures of probability distributions. For example, these methods enable the discretization of data into a group comprising inliers (

Identifiants

pubmed: 34667447
doi: 10.1107/S1600576721007317
pii: S1600576721007317
pmc: PMC8493619
doi:

Types de publication

Journal Article

Langues

eng

Pagination

1360-1378

Informations de copyright

© Marjan Hadian-Jazi et al. 2021.

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Auteurs

Marjan Hadian-Jazi (M)

ARC Centre of Excellence in Advanced Molecular Imaging, La Trobe Institute for Molecular Sciences, La Trobe University, Melbourne, Australia.
Australian Nuclear Science and Technology Organisation (ANSTO), Australia.
European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Alireza Sadri (A)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Anton Barty (A)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Oleksandr Yefanov (O)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Marina Galchenkova (M)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Dominik Oberthuer (D)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Dana Komadina (D)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Wolfgang Brehm (W)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Henry Kirkwood (H)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Grant Mills (G)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Raphael de Wijn (R)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Romain Letrun (R)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Marco Kloos (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Mohammad Vakili (M)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.

Luca Gelisio (L)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.

Connie Darmanin (C)

ARC Centre of Excellence in Advanced Molecular Imaging, La Trobe Institute for Molecular Sciences, La Trobe University, Melbourne, Australia.

Adrian P Mancuso (AP)

European XFEL, Holzkoppel 4, 22869 Schenefeld, Germany.
Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, Melbourne, Victoria, Australia.

Henry N Chapman (HN)

Center for Free-Electron Laser Science, Deutsches Elektronen-Synchrotron (DESY), Notkestrasse 85, 22607 Hamburg, Germany.
Department of Physics, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany.
The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761 Hamburg, Germany.

Brian Abbey (B)

ARC Centre of Excellence in Advanced Molecular Imaging, La Trobe Institute for Molecular Sciences, La Trobe University, Melbourne, Australia.

Classifications MeSH