Single-Molecule Junction Formation in Break-Junction Measurements.


Journal

The journal of physical chemistry letters
ISSN: 1948-7185
Titre abrégé: J Phys Chem Lett
Pays: United States
ID NLM: 101526034

Informations de publication

Date de publication:
11 Nov 2021
Historique:
pubmed: 2 11 2021
medline: 2 11 2021
entrez: 1 11 2021
Statut: ppublish

Résumé

The scanning tunneling microscope-based break-junction (STM-BJ) technique is the most common method used to study the electronic properties of single-molecule junctions. It relies on repeatedly forming and rupturing a Au contact in an environment of the target molecules. The probability of junction formation is typically very high (∼70-95%), prompting questions relating to how the nanoscale structure of the Au electrode before the metal point contact ruptures alters junction formation. Here we analyze conductance traces measured with the STM-BJ setup by combining correlation analysis and multiple machine learning tools, including gradient-boosted trees and neural networks. We show that two key features describing the Au-Au contact prior to rupture determine the extent of contact relaxation (snapback) and the probability of junction formation. Importantly, our data strongly indicate that molecular junctions are formed prior to the rupture of the Au-Au contact, explaining the high probability of junction formation observed in room-temperature solution measurements.

Identifiants

pubmed: 34723548
doi: 10.1021/acs.jpclett.1c03160
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

10802-10807

Auteurs

Tianren Fu (T)

Department of Chemistry, Columbia University, New York, New York 10027, United States.

Kathleen Frommer (K)

Department of Chemistry, Columbia University, New York, New York 10027, United States.

Colin Nuckolls (C)

Department of Chemistry, Columbia University, New York, New York 10027, United States.

Latha Venkataraman (L)

Department of Chemistry, Columbia University, New York, New York 10027, United States.
Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, United States.

Classifications MeSH