Nitrogen-Incorporated Boron-Doped Nanocrystalline Diamond Nanowires for Microplasma Illumination.

boron doping diamond nanowires microplasma illumination microstructural evolution nitrogen incorporation optical emission spectroscopy

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
24 Nov 2021
Historique:
pubmed: 17 11 2021
medline: 17 11 2021
entrez: 16 11 2021
Statut: ppublish

Résumé

The origin of nitrogen-incorporated boron-doped nanocrystalline diamond (NB-NCD) nanowires as a function of substrate temperature (

Identifiants

pubmed: 34781675
doi: 10.1021/acsami.1c16507
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

55687-55699

Auteurs

Salila Kumar Sethy (SK)

CSIR-Institute of Minerals and Materials Technology, Bhubaneswar 751013, India.

Mateusz Ficek (M)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk University of Technology, 80-233 Gdansk, Poland.

Kamatchi Jothiramalingam Sankaran (KJ)

CSIR-Institute of Minerals and Materials Technology, Bhubaneswar 751013, India.

Sourav Sain (S)

Department of Physics, School of Natural Sciences, Shiv Nadar University, Gautam Buddha Nagar, Uttar Pradesh 201314, India.

Anupam Ruturaj Tripathy (AR)

Institute of NanoEngineering and MicroSystems, National Tsing Hua University, Hsinchu 30013, Taiwan, Republic of China.

Shivam Gupta (S)

Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, Republic of China.

Jacek Ryl (J)

Department of Electrochemistry, Corrosion and Materials Engineering, Faculty of Chemistry, Gdansk University of Technology, 80-233 Gdansk, Poland.

Susanta Sinha Roy (S)

Department of Physics, School of Natural Sciences, Shiv Nadar University, Gautam Buddha Nagar, Uttar Pradesh 201314, India.

Nyan-Hwa Tai (NH)

Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan, Republic of China.

Robert Bogdanowicz (R)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdansk University of Technology, 80-233 Gdansk, Poland.

Classifications MeSH