GeSnOI mid-infrared laser technology.


Journal

Light, science & applications
ISSN: 2047-7538
Titre abrégé: Light Sci Appl
Pays: England
ID NLM: 101610753

Informations de publication

Date de publication:
17 Nov 2021
Historique:
received: 11 05 2021
accepted: 29 10 2021
revised: 25 10 2021
entrez: 17 11 2021
pubmed: 18 11 2021
medline: 18 11 2021
Statut: epublish

Résumé

GeSn alloys are promising materials for CMOS-compatible mid-infrared lasers manufacturing. Indeed, Sn alloying and tensile strain can transform them into direct bandgap semiconductors. This growing laser technology however suffers from a number of limitations, such as poor optical confinement, lack of strain, thermal, and defects management, all of which are poorly discussed in the literature. Herein, a specific GeSn-on-insulator (GeSnOI) stack using stressor layers as dielectric optical claddings is demonstrated to be suitable for a monolithically integration of planar Group-IV semiconductor lasers on a versatile photonic platform for the near- and mid-infrared spectral range. Microdisk-shape resonators on mesa structures were fabricated from GeSnOI, after bonding a Ge

Identifiants

pubmed: 34785641
doi: 10.1038/s41377-021-00675-7
pii: 10.1038/s41377-021-00675-7
pmc: PMC8595695
doi:

Types de publication

Journal Article

Langues

eng

Pagination

232

Subventions

Organisme : Agence Nationale de la Recherche (French National Research Agency)
ID : ANR-17-CE24-0015
Organisme : Agence Nationale de la Recherche (French National Research Agency)
ID : ANR-17-CE24-0015

Informations de copyright

© 2021. The Author(s).

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Auteurs

Binbin Wang (B)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Emilie Sakat (E)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Etienne Herth (E)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Maksym Gromovyi (M)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Andjelika Bjelajac (A)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Julien Chaste (J)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Gilles Patriarche (G)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France.

Philippe Boucaud (P)

Université Côte d'Azur, CNRS, CRHEA, Rue Bernard Grégory, 06905, Sophia-Antipolis, France.

Frédéric Boeuf (F)

STMicroelectronics, Rue Jean Monnet, 38054, Crolles, France.

Nicolas Pauc (N)

Université Grenoble Alpes, CEA, IRIG-DePhy, 17 rue des Martyrs, 38000, Grenoble, France.

Vincent Calvo (V)

Université Grenoble Alpes, CEA, IRIG-DePhy, 17 rue des Martyrs, 38000, Grenoble, France.

Jérémie Chrétien (J)

Université Grenoble Alpes, CEA, IRIG-DePhy, 17 rue des Martyrs, 38000, Grenoble, France.

Marvin Frauenrath (M)

Université Grenoble Alpes, CEA, Leti, 17 rue des Martyrs, 38000, Grenoble, France.

Alexei Chelnokov (A)

Université Grenoble Alpes, CEA, Leti, 17 rue des Martyrs, 38000, Grenoble, France.

Vincent Reboud (V)

Université Grenoble Alpes, CEA, Leti, 17 rue des Martyrs, 38000, Grenoble, France.

Jean-Michel Hartmann (JM)

Université Grenoble Alpes, CEA, Leti, 17 rue des Martyrs, 38000, Grenoble, France.

Moustafa El Kurdi (M)

Université Paris-Saclay, CNRS, C2N, 10 boulevard Thomas Gobert, 91120, Palaiseau, France. moustafa.el-kurdi@c2n.upsaclay.fr.

Classifications MeSH