Milliwatt-threshold visible-telecom optical parametric oscillation using silicon nanophotonics.


Journal

Optica
ISSN: 2334-2536
Titre abrégé: Optica
Pays: United States
ID NLM: 101643595

Informations de publication

Date de publication:
2019
Historique:
entrez: 19 11 2021
pubmed: 1 1 2019
medline: 1 1 2019
Statut: ppublish

Résumé

The on-chip creation of coherent light at visible wavelengths is crucial to field-level deployment of spectroscopy and metrology systems. Although on-chip lasers have been implemented in specific cases, a general solution that is not restricted by limitations of specific gain media has not been reported. Here, we propose creating visible light from an infrared pump by widely-separated optical parametric oscillation (OPO) using silicon nanophotonics. The OPO creates signal and idler light in the 700 nm and 1300 nm bands, respectively, with a 900 nm pump. It operates at a threshold power of (0.9 ± 0.1) mW, over 50× smaller than other widely-separated microcavity OPO works, which have only been reported in the infrared. This low threshold enables direct pumping without need of an intermediate optical amplifier. We further show how the device design can be modified to generate 780 nm and 1500 nm light with a similar power efficiency. Our nanophotonic OPO shows distinct advantages in power efficiency, operation stability, and device scalability, and is a major advance towards flexible on-chip generation of coherent visible light.

Identifiants

pubmed: 34796261
doi: 10.1364/optica.6.001535
pmc: PMC8596780
mid: NIHMS1588476
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Intramural NIST DOC
ID : 9999-NIST
Pays : United States

Références

Optica. 2017 Feb;4(2):193-203
pubmed: 28603754
Opt Lett. 2017 Jun 1;42(11):2110-2113
pubmed: 28569858
Nat Commun. 2018 Mar 20;9(1):1146
pubmed: 29559634
Opt Express. 2011 Jun 6;19(12):11415-21
pubmed: 21716372
Opt Lett. 2016 Nov 1;41(21):5102-5105
pubmed: 27805695
Opt Lett. 2011 Sep 1;36(17):3398-400
pubmed: 21886223
Opt Lett. 2005 Apr 1;30(7):762-4
pubmed: 15832930
Opt Lett. 2017 May 15;42(10):2010-2013
pubmed: 28504736
Phys Rev Lett. 2004 Aug 20;93(8):083904
pubmed: 15447188
Nat Phys. 2019;15:
pubmed: 31275426
Opt Lett. 2019 Jun 15;44(12):3146-3149
pubmed: 31199402
Opt Lett. 2017 Dec 15;42(24):5190-5193
pubmed: 29240179
Opt Lett. 1989 Jun 1;14(11):560-2
pubmed: 19752896
Opt Express. 2008 Jul 7;16(14):10596-610
pubmed: 18607474
Opt Lett. 2005 May 15;30(10):1234-6
pubmed: 15943319

Auteurs

Xiyuan Lu (X)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.

Gregory Moille (G)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.

Anshuman Singh (A)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.

Qing Li (Q)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA.

Daron A Westly (DA)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

Ashutosh Rao (A)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Maryland NanoCenter, University of Maryland, College Park, MD 20742, USA.

Su-Peng Yu (SP)

Time and Frequency Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO 80305, USA.
Department of Physics, University of Colorado, Boulder, CO 80309, USA.

Travis C Briles (TC)

Time and Frequency Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO 80305, USA.
Department of Physics, University of Colorado, Boulder, CO 80309, USA.

Scott B Papp (SB)

Time and Frequency Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Boulder, CO 80305, USA.
Department of Physics, University of Colorado, Boulder, CO 80309, USA.

Kartik Srinivasan (K)

Microsystems and Nanotechnology Division, Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Joint Quantum Institute, NIST/University of Maryland, College Park, MD 20742, USA.

Classifications MeSH