High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways.
Journal
Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288
Informations de publication
Date de publication:
22 11 2021
22 11 2021
Historique:
received:
01
09
2021
accepted:
01
11
2021
entrez:
23
11
2021
pubmed:
24
11
2021
medline:
24
11
2021
Statut:
epublish
Résumé
Scanning transmission electron microscopy (STEM) provides structural analysis with sub-angstrom resolution. But the pixel-by-pixel scanning process is a limiting factor in acquiring high-speed data. Different strategies have been implemented to increase scanning speeds while at the same time minimizing beam damage via optimizing the scanning strategy. Here, we achieve the highest possible scanning speed by eliminating the image acquisition dead time induced by the beam flyback time combined with reducing the amount of scanning pixels via sparse imaging. A calibration procedure was developed to compensate for the hysteresis of the magnetic scan coils. A combination of sparse and serpentine scanning routines was tested for a crystalline thin film, gold nanoparticles, and in an in-situ liquid phase STEM experiment. Frame rates of 92, 23 and 5.8 s
Identifiants
pubmed: 34811427
doi: 10.1038/s41598-021-02052-1
pii: 10.1038/s41598-021-02052-1
pmc: PMC8608981
doi:
Types de publication
Journal Article
Research Support, Non-U.S. Gov't
Langues
eng
Sous-ensembles de citation
IM
Pagination
22722Subventions
Organisme : Deutsche Forschungsgemeinschaft
ID : TFS-STEM
Informations de copyright
© 2021. The Author(s).
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