Influence of B/N co-doping on electrical and photoluminescence properties of CVD grown homoepitaxial diamond films.

activation energy boron/nitrogen co-doped diamond homoepitaxial nitrogen-vacancy

Journal

Nanotechnology
ISSN: 1361-6528
Titre abrégé: Nanotechnology
Pays: England
ID NLM: 101241272

Informations de publication

Date de publication:
28 Dec 2021
Historique:
received: 26 09 2021
accepted: 08 12 2021
pubmed: 9 12 2021
medline: 9 12 2021
entrez: 8 12 2021
Statut: epublish

Résumé

Boron doped diamond (BDD) has great potential in electrical, and electrochemical sensing applications. The growth parameters, substrates, and synthesis method play a vital role in the preparation of semiconducting BDD to metallic BDD. Doping of other elements along with boron (B) into diamond demonstrated improved efficacy of B doping and exceptional properties. In the present study, B and nitrogen (N) co-doped diamond has been synthesized on single crystalline diamond (SCD) IIa and SCD Ib substrates in a microwave plasma-assisted chemical vapor deposition process. The B/N co-doping into CVD diamond has been conducted at constant N flow of N/C ∼ 0.02 with three different B/C doping concentrations of B/C ∼ 2500 ppm, 5000 ppm, 7500 ppm. Atomic force microscopy topography depicted the flat and smooth surface with low surface roughness for low B doping, whereas surface features like hillock structures and un-epitaxial diamond crystals with high surface roughness were observed for high B doping concentrations. KPFM measurements revealed that the work function (4.74-4.94 eV) has not varied significantly for CVD diamond synthesized with different B/C concentrations. Raman spectroscopy measurements described the growth of high-quality diamond and photoluminescence studies revealed the formation of high-density nitrogen-vacancy centers in CVD diamond layers. X-ray photoelectron spectroscopy results confirmed the successful B doping and the increase in N doping with B doping concentration. The room temperature electrical resistance measurements of CVD diamond layers (B/C ∼ 7500 ppm) have shown the low resistance value ∼9.29 Ω for CVD diamond/SCD IIa, and the resistance value ∼16.55 Ω for CVD diamond/SCD Ib samples.

Identifiants

pubmed: 34879361
doi: 10.1088/1361-6528/ac4130
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Informations de copyright

Creative Commons Attribution license.

Auteurs

Srinivasu Kunuku (S)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-233, Gdańsk, Poland.

Mateusz Ficek (M)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-233, Gdańsk, Poland.

Aleksandra Wieloszynska (A)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-233, Gdańsk, Poland.

Magdalena Tamulewicz-Szwajkowska (M)

Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17 St., 50-372, Wrocław, Poland.

Krzysztof Gajewski (K)

Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17 St., 50-372, Wrocław, Poland.

Miroslaw Sawczak (M)

The Szewalski Institute of Fluid-Flow Machinery, Polish Academy of Sciences, 80-231, Gdansk, Poland.

Aneta Lewkowicz (A)

Institute of Experimental Physics, Faculty of Mathematics, Physics and Informatics, University of Gdansk, Wita Stwosza 57, 80-952 Gdansk, Poland.

Jacek Ryl (J)

Institute of Nanotechnology and Materials Engineering, Gdansk University of Technology, Narutowicza 11/12, 80-233 Gdansk, Poland.

Tedor Gotszalk (T)

Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17 St., 50-372, Wrocław, Poland.

Robert Bogdanowicz (R)

Department of Metrology and Optoelectronics, Faculty of Electronics, Telecommunications and Informatics, Gdańsk University of Technology, 11/12 Narutowicza St., 80-233, Gdańsk, Poland.

Classifications MeSH