Characterization of the Interfacial Orientation and Molecular Conformation in a Glass-Forming Organic Semiconductor.

NEXAFS spectroscopy buried interface coarse-grained simulations organic semiconductor polarized resonant soft X-ray reflectivity thin films

Journal

ACS applied materials & interfaces
ISSN: 1944-8252
Titre abrégé: ACS Appl Mater Interfaces
Pays: United States
ID NLM: 101504991

Informations de publication

Date de publication:
19 Jan 2022
Historique:
pubmed: 5 1 2022
medline: 5 1 2022
entrez: 4 1 2022
Statut: ppublish

Résumé

The ability to control structure in molecular glasses has enabled them to play a key role in modern technology; in particular, they are ubiquitous in organic light-emitting diodes. While the interplay between bulk structure and optoelectronic properties has been extensively investigated, few studies have examined molecular orientation near buried interfaces despite its critical role in emergent functionality. Direct, quantitative measurements of buried molecular orientation are inherently challenging, and many methods are insensitive to orientation in amorphous soft matter or lack the necessary spatial resolution. To overcome these challenges, we use polarized resonant soft X-ray reflectivity (p-RSoXR) to measure nanometer-resolved, molecular orientation depth profiles of vapor-deposited thin films of an organic semiconductor Tris(4-carbazoyl-9-ylphenyl)amine (TCTA). Our depth profiling approach characterizes the vertical distribution of molecular orientation and reveals that molecules near the inorganic substrate and free surface have a different, nearly isotropic orientation compared to those of the anisotropic bulk. Comparison of p-RSoXR results with near-edge X-ray absorption fine structure spectroscopy and optical spectroscopies reveals that TCTA molecules away from the interfaces are predominantly planar, which may contribute to their attractive charge transport qualities. Buried interfaces are further investigated in a TCTA bilayer (each layer deposited under separate conditions resulting in different orientations) in which we find a narrow interface between orientationally distinct layers extending across ≈1 nm. Coupling this result with molecular dynamics simulations provides additional insight into the formation of interfacial structure. This study characterizes the local molecular orientation at various types of buried interfaces in vapor-deposited glasses and provides a foundation for future studies to develop critical structure-function relationships.

Identifiants

pubmed: 34982543
doi: 10.1021/acsami.1c19948
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

3455-3466

Auteurs

Thomas J Ferron (TJ)

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Jacob L Thelen (JL)

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Kushal Bagchi (K)

Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States.

Chuting Deng (C)

Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.

Eliot Gann (E)

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Juan J de Pablo (JJ)

Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States.

M D Ediger (MD)

Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706, United States.

Daniel F Sunday (DF)

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Dean M DeLongchamp (DM)

National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Classifications MeSH