A review on modern defect detection models using DCNNs - Deep convolutional neural networks.
Deep convolutional neural networks
Deeplearning
Defect detection
Image classification
Object detection
Journal
Journal of advanced research
ISSN: 2090-1224
Titre abrégé: J Adv Res
Pays: Egypt
ID NLM: 101546952
Informations de publication
Date de publication:
01 2022
01 2022
Historique:
received:
04
02
2021
revised:
10
03
2021
accepted:
31
03
2021
entrez:
13
1
2022
pubmed:
14
1
2022
medline:
27
1
2022
Statut:
epublish
Résumé
Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models won the Image Net Large Scale Visual Recognition Contest, it proved that this area of research is of great potential. Furthermore, these increases in recognition performance resulted in more applied research and thus, more applications where deeplearning is useful: one of which is defect detection (or visual defect detection). In the last few years, deeplearning models achieved higher and higher accuracy on the complex testing datasets used for benchmarking. This surge in accuracy and usage is also supported (besides swarms of researchers pouring into the race), by incremental breakthroughs in computing hardware: such as more powerful GPUs(Graphical processing units), CPUs(central processing units) and better computing procedures (libraries and frameworks). To offer a structured and analytical overview(stating both advantages and disadvantages) of the existing popular object detection models that can be re-purposed for defect detection: such as Region based CNNs(Convolutional neural networks), YOLO(You only look once), SSD(single shot detectors) and cascaded architectures. A further brief summary on model compression and acceleration techniques that enabled the portability of deeplearning detection models is included. It is of great use for future developments in the manufacturing industry that many of the popular, above mentioned models are easy to re-purpose for defect detection and, thus could really contribute to the overall increase in productivity of this sector. Moreover, in the experiment performed the YOLOv4 model was trained and re-purposed for industrial cable detection in several hours. The computing needs could be fulfilled by a general purpose computer or by a high-performance desktop setup, depending on the specificity of the application. Hence, the barrier of computing shall be somewhat easier to climb for all types of businesses.
Sections du résumé
Background
Over the last years Deep Learning has shown to yield remarkable results when compared to traditional computer vision algorithms, in a large variety of computer vision applications. The deeplearning models outperformed in both accuracy and processing time. Thus, once a deeplearning models won the Image Net Large Scale Visual Recognition Contest, it proved that this area of research is of great potential. Furthermore, these increases in recognition performance resulted in more applied research and thus, more applications where deeplearning is useful: one of which is defect detection (or visual defect detection). In the last few years, deeplearning models achieved higher and higher accuracy on the complex testing datasets used for benchmarking. This surge in accuracy and usage is also supported (besides swarms of researchers pouring into the race), by incremental breakthroughs in computing hardware: such as more powerful GPUs(Graphical processing units), CPUs(central processing units) and better computing procedures (libraries and frameworks).
Aim of the review
To offer a structured and analytical overview(stating both advantages and disadvantages) of the existing popular object detection models that can be re-purposed for defect detection: such as Region based CNNs(Convolutional neural networks), YOLO(You only look once), SSD(single shot detectors) and cascaded architectures. A further brief summary on model compression and acceleration techniques that enabled the portability of deeplearning detection models is included.
Key Scientific Concepts of Review
It is of great use for future developments in the manufacturing industry that many of the popular, above mentioned models are easy to re-purpose for defect detection and, thus could really contribute to the overall increase in productivity of this sector. Moreover, in the experiment performed the YOLOv4 model was trained and re-purposed for industrial cable detection in several hours. The computing needs could be fulfilled by a general purpose computer or by a high-performance desktop setup, depending on the specificity of the application. Hence, the barrier of computing shall be somewhat easier to climb for all types of businesses.
Identifiants
pubmed: 35024194
doi: 10.1016/j.jare.2021.03.015
pii: S2090-1232(21)00064-3
pmc: PMC8721352
doi:
Types de publication
Journal Article
Research Support, Non-U.S. Gov't
Review
Langues
eng
Sous-ensembles de citation
IM
Pagination
33-48Informations de copyright
© 2021 The Authors. Published by Elsevier B.V. on behalf of Cairo University.
Déclaration de conflit d'intérêts
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Références
IEEE Trans Pattern Anal Mach Intell. 2017 Jun;39(6):1137-1149
pubmed: 27295650
Sensors (Basel). 2020 Apr 01;20(7):
pubmed: 32244764
IEEE Trans Pattern Anal Mach Intell. 2020 Feb;42(2):386-397
pubmed: 29994331
IEEE Trans Image Process. 2022 Oct 28;PP:
pubmed: 36306307
J Adv Res. 2019 Jan 12;17:31-42
pubmed: 31193359
Comput Intell Neurosci. 2018 Feb 1;2018:7068349
pubmed: 29487619
Sensors (Basel). 2020 Sep 17;20(18):
pubmed: 32957519
IEEE Trans Pattern Anal Mach Intell. 1980 Mar;2(3):204-22
pubmed: 21868894
J Adv Res. 2019 Jul 05;20:141-152
pubmed: 31452958
IEEE Trans Pattern Anal Mach Intell. 2015 Sep;37(9):1904-16
pubmed: 26353135