Spatially Resolved Band Gap and Dielectric Function in Two-Dimensional Materials from Electron Energy Loss Spectroscopy.


Journal

The journal of physical chemistry. A
ISSN: 1520-5215
Titre abrégé: J Phys Chem A
Pays: United States
ID NLM: 9890903

Informations de publication

Date de publication:
24 Feb 2022
Historique:
pubmed: 16 2 2022
medline: 16 2 2022
entrez: 15 2 2022
Statut: ppublish

Résumé

The electronic properties of two-dimensional (2D) materials depend sensitively on the underlying atomic arrangement down to the monolayer level. Here we present a novel strategy for the determination of the band gap and complex dielectric function in 2D materials achieving a spatial resolution down to a few nanometers. This approach is based on machine learning techniques developed in particle physics and makes possible the automated processing and interpretation of spectral images from electron energy loss spectroscopy (EELS). Individual spectra are classified as a function of the thickness with

Identifiants

pubmed: 35167301
doi: 10.1021/acs.jpca.1c09566
pmc: PMC8883475
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

1255-1262

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Auteurs

Abel Brokkelkamp (A)

Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands.

Jaco Ter Hoeve (J)

Nikhef Theory Group, Science Park 105, 1098 XG Amsterdam, The Netherlands.
Physics and Astronomy, Vrije Universiteit Amsterdam, 1081 HV Amsterdam, The Netherlands.

Isabel Postmes (I)

Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands.

Sabrya E van Heijst (SE)

Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands.

Louis Maduro (L)

Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands.

Albert V Davydov (AV)

Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Sergiy Krylyuk (S)

Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States.

Juan Rojo (J)

Nikhef Theory Group, Science Park 105, 1098 XG Amsterdam, The Netherlands.
Physics and Astronomy, Vrije Universiteit Amsterdam, 1081 HV Amsterdam, The Netherlands.

Sonia Conesa-Boj (S)

Kavli Institute of Nanoscience, Delft University of Technology, 2628CJ Delft, The Netherlands.

Classifications MeSH