Deconvolution of Light-Induced Ion Migration Phenomena by Statistical Analysis of Cathodoluminescence in Lead Halide-Based Perovskites.

cathodoluminescence ion migrations perovskites surface passivation

Journal

Advanced science (Weinheim, Baden-Wurttemberg, Germany)
ISSN: 2198-3844
Titre abrégé: Adv Sci (Weinh)
Pays: Germany
ID NLM: 101664569

Informations de publication

Date de publication:
May 2022
Historique:
revised: 18 01 2022
received: 25 08 2021
pubmed: 4 3 2022
medline: 4 3 2022
entrez: 3 3 2022
Statut: ppublish

Résumé

Studying the compositional instability of mixed ion perovskites under light illumination is important to understand the mechanisms underlying their efficiency and stability. However, current techniques are limited in resolution and are unable to deconvolute minor ion migration phenomena. Here, a method that enables ion migration to be studied allowing different segregation mechanisms to be elucidated is described. Statistical analysis is applied to cathodoluminescence data to generate compositional distribution histograms. Using these histograms, two different ion migration phenomena, horizontal ion migration (HIM) and vertical ion migration (VIM), are identified in different perovskite films. It is found that most passivating agents inhibit HIM, but not VIM. However, VIM can be reduced by deposition of imidazolium iodide on the perovskite surface. This method can be used to study perovskite-based devices efficiency and stability by providing molecular level mechanistic understanding of passivation approaches leading to performance improvement of perovskite solar cells via rational design.

Identifiants

pubmed: 35238172
doi: 10.1002/advs.202103729
pmc: PMC9069390
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

e2103729

Subventions

Organisme : Swiss National Science Foundation
ID : 20B2-1_176680
Pays : Switzerland

Informations de copyright

© 2022 The Authors. Advanced Science published by Wiley-VCH GmbH.

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Auteurs

Erfan Shirzadi (E)

Institute of Chemical Sciences and Engineering, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, CH-1015, Switzerland.

Nicolas Tappy (N)

Laboratoire des Matériaux Semiconducteurs, Institute of Materials, Faculty of Engineering, École Polytechnique Fédérale de Lausanne, Lausanne, 1015, Switzerland.

Fatemeh Ansari (F)

Institute of Chemical Sciences and Engineering, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, CH-1015, Switzerland.

Mohammad Khaja Nazeeruddin (MK)

Institute of Chemical Sciences and Engineering, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, CH-1015, Switzerland.

Anders Hagfeldt (A)

Institute of Chemical Sciences and Engineering, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, CH-1015, Switzerland.

Paul J Dyson (PJ)

Institute of Chemical Sciences and Engineering, Swiss Federal Institute of Technology Lausanne (EPFL), Lausanne, CH-1015, Switzerland.

Classifications MeSH