Confocal Raman Microscopy for the Analysis of the Three-Dimensional Shape of Polymeric Microsphere Layers.

3D imaging Confocal Raman microscopy Raman standard depth profiling mapping polystyrene microsphere spatial resolution

Journal

Applied spectroscopy
ISSN: 1943-3530
Titre abrégé: Appl Spectrosc
Pays: United States
ID NLM: 0372406

Informations de publication

Date de publication:
Jun 2022
Historique:
pubmed: 10 3 2022
medline: 10 3 2022
entrez: 9 3 2022
Statut: ppublish

Résumé

The reconstruction of the three-dimensional (3D) morphology of polymeric microsphere layers based on confocal Raman microscopy was studied. Refraction of the Raman laser beam at the curved surface of the spheres broadens the focus volume inside the sphere. Compared to planar layers, the focus gets trapped inside the spheres such that the measured depth profiles are shifted and broadened. Additionally, the Raman signal of the underlying substrate is already observed for nominal focus positions above the microsphere layer. The results are successfully modeled with ray-optical simulations that allow for a clear understanding of the relevant mechanisms that lead to the generation of the Raman signals in the complex three-dimensional structures.

Identifiants

pubmed: 35259964
doi: 10.1177/00037028211067827
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

678-688

Auteurs

Alina Syring (A)

Institut für Halbleitertechnik, 26527Technische Universität Braunschweig, Braunschweig, Germany.
26527Laboratory of Emerging Nanometrology (LENA) der Technischen Universität Braunschweig, Braunschweig, Germany.

Zunhao Wang (Z)

39428Physikalisch-Technische Bundesanstalt, Braunschweig, Germany.

Julia Molle (J)

39428Physikalisch-Technische Bundesanstalt, Braunschweig, Germany.

Hendrik Keese (H)

Institut für Halbleitertechnik, 26527Technische Universität Braunschweig, Braunschweig, Germany.
26527Laboratory of Emerging Nanometrology (LENA) der Technischen Universität Braunschweig, Braunschweig, Germany.

Stefan Wundrack (S)

39428Physikalisch-Technische Bundesanstalt, Braunschweig, Germany.

Rainer Stosch (R)

39428Physikalisch-Technische Bundesanstalt, Braunschweig, Germany.

Tobias Voss (T)

Institut für Halbleitertechnik, 26527Technische Universität Braunschweig, Braunschweig, Germany.
26527Laboratory of Emerging Nanometrology (LENA) der Technischen Universität Braunschweig, Braunschweig, Germany.

Classifications MeSH