Control of Ni/β-Ga

SBD bandgap electron-beam evaporation graphene interfacial traps workfunction β-Ga2O3

Journal

Nanomaterials (Basel, Switzerland)
ISSN: 2079-4991
Titre abrégé: Nanomaterials (Basel)
Pays: Switzerland
ID NLM: 101610216

Informations de publication

Date de publication:
01 Mar 2022
Historique:
received: 29 01 2022
revised: 20 02 2022
accepted: 26 02 2022
entrez: 10 3 2022
pubmed: 11 3 2022
medline: 11 3 2022
Statut: epublish

Résumé

Controlling the Schottky barrier height (ϕB) and other parameters of Schottky barrier diodes (SBD) is critical for many applications. In this work, the effect of inserting a graphene interfacial monolayer between a Ni Schottky metal and a β-Ga2O3 semiconductor was investigated using numerical simulation. We confirmed that the simulation-based on Ni workfunction, interfacial trap concentration, and surface electron affinity was well-matched with the actual device characterization. Insertion of the graphene layer achieved a remarkable decrease in the barrier height (ϕB), from 1.32 to 0.43 eV, and in the series resistance (RS), from 60.3 to 2.90 mΩ.cm2. However, the saturation current (JS) increased from 1.26×10−11 to 8.3×10−7(A/cm2). The effects of a graphene bandgap and workfunction were studied. With an increase in the graphene workfunction and bandgap, the Schottky barrier height and series resistance increased and the saturation current decreased. This behavior was related to the tunneling rate variations in the graphene layer. Therefore, control of Schottky barrier diode output parameters was achieved by monitoring the tunneling rate in the graphene layer (through the control of the bandgap) and by controlling the Schottky barrier height according to the Schottky−Mott role (through the control of the workfunction). Furthermore, a zero-bandgap and low-workfunction graphene layer behaves as an ohmic contact, which is in agreement with published results.

Identifiants

pubmed: 35269314
pii: nano12050827
doi: 10.3390/nano12050827
pmc: PMC8912321
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Ministry of Trade, Industry and Energy
ID : P0012451
Organisme : Ministry of Trade, Industry and Energy
ID : 20016102

Références

Nano Lett. 2018 Feb 14;18(2):682-688
pubmed: 29300487
Chem Soc Rev. 2018 May 8;47(9):3059-3099
pubmed: 29513306
Nanoscale Res Lett. 2018 Sep 19;13(1):290
pubmed: 30232628

Auteurs

Madani Labed (M)

Laboratory of Semiconducting and Metallic Materials (LMSM), University of Biskra, Biskra 07000, Algeria.

Nouredine Sengouga (N)

Laboratory of Semiconducting and Metallic Materials (LMSM), University of Biskra, Biskra 07000, Algeria.

You Seung Rim (YS)

Department of Intelligent Mechatronics Engineering and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Korea.

Classifications MeSH