Structured transmittance illumination coherence holography.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
16 Mar 2022
Historique:
received: 22 09 2021
accepted: 20 01 2022
entrez: 17 3 2022
pubmed: 18 3 2022
medline: 18 3 2022
Statut: epublish

Résumé

The coherence holography offers an unconventional way to reconstruct the hologram where an incoherent light illumination is used for reconstruction purposes, and object encoded into the hologram is reconstructed as the distribution of the complex coherence function. Measurement of the coherence function usually requires an interferometric setup and array detectors. This paper presents an entirely new idea of reconstruction of the complex coherence function in the coherence holography without an interferometric setup. This is realized by structured pattern projections on the incoherent source structure and implementing measurement of the cross-covariance of the intensities by a single-pixel detector. This technique, named structured transmittance illumination coherence holography (STICH), helps to reconstruct the complex coherence from the intensity measurement in a single-pixel detector without an interferometric setup and also keeps advantages of the intensity correlations. A simple experimental setup is presented as a first step to realize the technique, and results based on the computer modeling of the experimental setup are presented to show validation of the idea.

Identifiants

pubmed: 35296757
doi: 10.1038/s41598-022-08603-4
pii: 10.1038/s41598-022-08603-4
pmc: PMC8927146
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

4564

Subventions

Organisme : Science and Engineering Research Board (SERB) India
ID : CORE/2019/000026
Organisme : Department of Biotechnology, Ministry of Science and Technology, India
ID : BT/PR35557/MED/32/707/2019

Informations de copyright

© 2022. The Author(s).

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Auteurs

Aditya Chandra Mandal (AC)

Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.
Department of Mining Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.

Tushar Sarkar (T)

Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India.

Zeev Zalevsky (Z)

Faculty of Engineering and Nano Technology Center, Bar-Ilan University, Ramat-Gan, Israel.

Rakesh Kumar Singh (RK)

Laboratory of Information Photonics and Optical Metrology, Department of Physics, Indian Institute of Technology (Banaras Hindu University), Varanasi, Uttar Pradesh, 221005, India. krakeshsingh.phy@iitbhu.ac.in.

Classifications MeSH