Fermi-Level Pinning-Free WSe

2D materials Fermi-level pinning Schottky-Mott limit complementary metal-oxide-semiconductors van der Waals contacts

Journal

Advanced materials (Deerfield Beach, Fla.)
ISSN: 1521-4095
Titre abrégé: Adv Mater
Pays: Germany
ID NLM: 9885358

Informations de publication

Date de publication:
May 2022
Historique:
revised: 16 03 2022
received: 05 12 2021
pubmed: 21 3 2022
medline: 21 3 2022
entrez: 20 3 2022
Statut: ppublish

Résumé

Precise control over the polarity of transistors is a key necessity for the construction of complementary metal-oxide-semiconductor circuits. However, the polarity control of 2D transistors remains a challenge because of the lack of a high-work-function electrode that completely eliminates Fermi-level pinning at metal-semiconductor interfaces. Here, a creation of clean van der Waals contacts is demonstrated, wherein a metallic 2D material, chlorine-doped SnSe

Identifiants

pubmed: 35306686
doi: 10.1002/adma.202109899
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

e2109899

Subventions

Organisme : Korea Institute of Science and Technology
ID : 2E31532
Organisme : National Research Foundation of Korea
ID : 2021M3D1A2046731
Organisme : Institute for Information and Communications Technology Promotion
ID : 2020-0-00841

Informations de copyright

© 2022 The Authors. Advanced Materials published by Wiley-VCH GmbH.

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Auteurs

Jisu Jang (J)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.
Division of Nano & Information Technology, KIST School, University of Science and Technology (UST), Seoul, 02792, Republic of Korea.

Hyun-Soo Ra (HS)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.

Jongtae Ahn (J)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.

Tae Wook Kim (TW)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.

Seung Ho Song (SH)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.
SKKU Advanced Institute of Nano Technology (SAINT), Sungkyunkwan University (SKKU), Suwon, 16419, Korea.

Soohyung Park (S)

Advanced Analysis Center, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.

Takashi Taniguch (T)

Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, 305-0044, Japan.

Kenji Watanabe (K)

Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, 305-0044, Japan.

Kimoon Lee (K)

Department of Physics, Kunsan National University, Gunsan, 54150, Republic of Korea.

Do Kyung Hwang (DK)

Center for Opto-Electronic Materials and Devices, Post-Silicon Semiconductor Institute, Korea Institute of Science and Technology (KIST), Seoul, 02792, Republic of Korea.
Division of Nano & Information Technology, KIST School, University of Science and Technology (UST), Seoul, 02792, Republic of Korea.

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