Robust Electronic Structure of Manganite-Buffered Oxide Interfaces with Extreme Mobility Enhancement.
electronic structure
electron−phonon interaction
high mobility 2DEG
oxide interfaces
resonant angle-resolved photoemission spectroscopy
Journal
ACS nano
ISSN: 1936-086X
Titre abrégé: ACS Nano
Pays: United States
ID NLM: 101313589
Informations de publication
Date de publication:
26 Apr 2022
26 Apr 2022
Historique:
pubmed:
22
3
2022
medline:
22
3
2022
entrez:
21
3
2022
Statut:
ppublish
Résumé
The electronic structure as well as the mechanism underlying the high-mobility two-dimensional electron gases (2DEGs) at complex oxide interfaces remain elusive. Herein, using soft X-ray angle-resolved photoemission spectroscopy (ARPES), we present the band dispersion of metallic states at buffered LaAlO
Identifiants
pubmed: 35312282
doi: 10.1021/acsnano.2c00609
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM