Relation between Reactive Surface Sites and Precursor Choice for Area-Selective Atomic Layer Deposition Using Small Molecule Inhibitors.


Journal

The journal of physical chemistry. C, Nanomaterials and interfaces
ISSN: 1932-7447
Titre abrégé: J Phys Chem C Nanomater Interfaces
Pays: United States
ID NLM: 101299949

Informations de publication

Date de publication:
17 Mar 2022
Historique:
received: 23 12 2021
revised: 15 02 2022
entrez: 25 3 2022
pubmed: 26 3 2022
medline: 26 3 2022
Statut: ppublish

Résumé

Implementation of vapor/phase dosing of small molecule inhibitors (SMIs) in advanced atomic layer deposition (ALD) cycles is currently being considered for bottom-up fabrication by area-selective ALD. When SMIs are used, it can be challenging to completely block precursor adsorption due to the inhibitor size and the relatively short vapor/phase exposures. Two strategies for precursor blocking are explored: (i) physically covering precursor adsorption sites, i.e., steric shielding, and (ii) eliminating precursor adsorption sites from the surface, i.e., chemical passivation. In this work, it is determined whether steric shielding is enough for effective precursor blocking during area-selective ALD or whether chemical passivation is required as well. At the same time, we address why some ALD precursors are more difficult to block than others. To this end, the blocking of the Al precursor molecules trimethylaluminum (TMA), dimethylaluminum isopropoxide (DMAI), and tris(dimethylamino)aluminum (TDMAA) was studied by using acetylacetone (Hacac) as inhibitor. It was found that DMAI and TDMAA are more easily blocked than TMA because they adsorb on the same surface sites as Hacac, while TMA is also reactive with other surface sites. This work shows that chemical passivation plays a crucial role for precursor blocking in concert with steric shielding. Moreover, the reactivity of the precursor with the surface groups on the non-growth area dictates the effectiveness of blocking precursor adsorption.

Identifiants

pubmed: 35330759
doi: 10.1021/acs.jpcc.1c10816
pmc: PMC8935369
doi:

Types de publication

Journal Article

Langues

eng

Pagination

4845-4853

Informations de copyright

© 2022 The Authors. Published by American Chemical Society.

Déclaration de conflit d'intérêts

The authors declare no competing financial interest.

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Auteurs

Marc J M Merkx (MJM)

Department of Applied Physics, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands.

Athanasios Angelidis (A)

Department of Applied Physics, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands.

Alfredo Mameli (A)

TNO-Holst Centre, 5656 AE Eindhoven, The Netherlands.

Jun Li (J)

Department of Applied Physics, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands.

Paul C Lemaire (PC)

Lam Research Corporation, Tualatin, Oregon 97062, United States.

Kashish Sharma (K)

Lam Research Corporation, Tualatin, Oregon 97062, United States.

Dennis M Hausmann (DM)

Lam Research Corporation, Tualatin, Oregon 97062, United States.

Wilhelmus M M Kessels (WMM)

Department of Applied Physics, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands.

Tania E Sandoval (TE)

Department of Chemical and Environmental Engineering, Universidad Técnica Federico Santa María, 8940000 Santiago, Chile.

Adriaan J M Mackus (AJM)

Department of Applied Physics, Eindhoven University of Technology, 5600MB Eindhoven, The Netherlands.

Classifications MeSH