Effect of electron beam irradiation in gas atmosphere during ETEM.
Electron beam
Gas environmental
Ionization
Irradiation
Nitrogen
Journal
Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850
Informations de publication
Date de publication:
Jul 2022
Jul 2022
Historique:
received:
12
12
2021
revised:
18
04
2022
accepted:
20
04
2022
pubmed:
2
5
2022
medline:
2
5
2022
entrez:
1
5
2022
Statut:
ppublish
Résumé
Transmission electron microscopy (TEM) is used to observe the atomic structures of materials. Environmental TEM (ETEM) is a method wherein a gas can be evaluated and it has been used to observe the dynamic reaction between materials and gases at the atomic level. An electron beam (EB), which has a sufficiently high energy (exceeding a few tens of kilovolts), can be used to ionize gas molecules. Subsequently, the ionized molecules might react with the materials during ETEM. Therefore, the current generated by the ions and electrons were measured to verify the presence of ions generated due to the ionization of the N
Identifiants
pubmed: 35490496
pii: S0968-4328(22)00085-3
doi: 10.1016/j.micron.2022.103289
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
103289Informations de copyright
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