Single-shot spectrometer using diamond microcrystals for X-ray free-electron laser pulses.

SACLA X-ray free-electron lasers single-shot spectrometers

Journal

Journal of synchrotron radiation
ISSN: 1600-5775
Titre abrégé: J Synchrotron Radiat
Pays: United States
ID NLM: 9888878

Informations de publication

Date de publication:
01 May 2022
Historique:
received: 27 10 2021
accepted: 01 02 2022
entrez: 5 5 2022
pubmed: 6 5 2022
medline: 6 5 2022
Statut: ppublish

Résumé

A simple spectrometer using diffraction from diamond microcrystals has been developed to diagnose single-shot spectra of X-ray free-electron laser (XFEL) pulses. The large grain size and uniform lattice constant of the adopted crystals enable characterizing the XFEL spectrum at a resolution of a few eV from the peak shape of the powder diffraction profile. This single-shot spectrometer has been installed at beamline 3 of SACLA and is used for daily machine tuning.

Identifiants

pubmed: 35511018
pii: S1600577522001205
doi: 10.1107/S1600577522001205
pmc: PMC9070727
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

862-865

Subventions

Organisme : Japan Society for the Promotion of Science
ID : 19K20604

Informations de copyright

open access.

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pubmed: 34738953
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Auteurs

Ichiro Inoue (I)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Eito Iwai (E)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Toru Hara (T)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Yuichi Inubushi (Y)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Kensuke Tono (K)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Makina Yabashi (M)

RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo, Hyogo 679-5148, Japan.

Classifications MeSH