The influence mechanism of nanoparticles on the dielectric properties of epoxy resin.


Journal

RSC advances
ISSN: 2046-2069
Titre abrégé: RSC Adv
Pays: England
ID NLM: 101581657

Informations de publication

Date de publication:
19 Jun 2019
Historique:
received: 17 04 2019
accepted: 12 06 2019
entrez: 6 5 2022
pubmed: 24 6 2019
medline: 24 6 2019
Statut: epublish

Résumé

In order to study the influence mechanism of nanoparticles on the dielectric properties of epoxy resin materials for composite insulators under different nanoparticle filling amounts, the free volume, dielectric relaxation, breakdown strength and trap distribution of the samples were tested by positron annihilation lifetime spectroscopy, breakdown strength, broadband dielectric spectroscopy (BDS) and thermally stimulated current (TSC). The results show that the limiting effect of nanoparticles rapidly reduced the number of traps in the amorphous zone of materials at a low filling amount. As a result, the free path of carriers was increased and the concentration of free volume was decreased, which can limit the injection and transportation of carriers, resulting in the increase of material breakdown strength. At a high filling amount, a large number of interfacial deep traps were introduced into the nanoparticles, and the carrier free volume concentration and size were reduced. The traps inside the material were mainly interfacial deep traps. Under the action of an external electric field, a hetero polar charge was formed on the other end to cause electric field distortion, thus the breakdown field strength of the material was weakened.

Identifiants

pubmed: 35519404
doi: 10.1039/c9ra02889g
pii: c9ra02889g
pmc: PMC9065294
doi:

Types de publication

Journal Article

Langues

eng

Pagination

19648-19656

Informations de copyright

This journal is © The Royal Society of Chemistry.

Déclaration de conflit d'intérêts

There are no conflicts to declare.

Références

Nat Mater. 2007 Apr;6(4):257-8
pubmed: 17401415
J Phys Chem B. 2006 Sep 21;110(37):18236-42
pubmed: 16970441
Nanoscale. 2013 May 21;5(10):4404-11
pubmed: 23575605
RSC Adv. 2019 Jan 7;9(2):790-800
pubmed: 35517628
Inorg Chem. 2009 Mar 2;48(5):1819-25
pubmed: 19235945

Auteurs

Rui Wang (R)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Congzhen Xie (C)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Shoukang Luo (S)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Bin Gou (B)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Huasong Xu (H)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Leilei Zeng (L)

School of Electric Power, South China University of Technology Guangzhou 510641 China congzhen168@163.com.

Classifications MeSH