In situ process quality monitoring and defect detection for direct metal laser melting.


Journal

Scientific reports
ISSN: 2045-2322
Titre abrégé: Sci Rep
Pays: England
ID NLM: 101563288

Informations de publication

Date de publication:
19 May 2022
Historique:
received: 26 09 2021
accepted: 14 04 2022
entrez: 19 5 2022
pubmed: 20 5 2022
medline: 20 5 2022
Statut: epublish

Résumé

Quality control and quality assurance are challenges in direct metal laser melting (DMLM). Intermittent machine diagnostics and downstream part inspections catch problems after undue cost has been incurred processing defective parts. In this paper we demonstrate two methodologies for in-process fault detection and part quality prediction that leverage existing commercial DMLM systems with minimal hardware modification. Novel features were derived from the time series of common photodiode sensors along with standard machine control signals. In one methodology, a Bayesian approach attributes measurements to one of multiple process states as a means of classifying process deviations. In a second approach, a least squares regression model predicts severity of certain material defects.

Identifiants

pubmed: 35589844
doi: 10.1038/s41598-022-12381-4
pii: 10.1038/s41598-022-12381-4
pmc: PMC9119964
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

8503

Subventions

Organisme : Air Force Research Laboratory
ID : FA8650-14-C-5702

Informations de copyright

© 2022. The Author(s).

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Auteurs

Sarah Felix (S)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Saikat Ray Majumder (S)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA. raymajumder@ge.com.

H Kirk Mathews (HK)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Michael Lexa (M)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Gabriel Lipsa (G)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Xiaohu Ping (X)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Subhrajit Roychowdhury (S)

GE Research, 1 Research Circle, Niskayuna, NY, 12309, USA.

Thomas Spears (T)

GE Additive, OH, Cincinnati, USA.

Classifications MeSH