The Electrical Response of Real Dielectrics: Using the Voltage Ramp Method as a Straightforward Diagnostic Tool for Polymeric Composites.

dielectrics electrical response lumped circuits modeling polymeric composites

Journal

Materials (Basel, Switzerland)
ISSN: 1996-1944
Titre abrégé: Materials (Basel)
Pays: Switzerland
ID NLM: 101555929

Informations de publication

Date de publication:
27 May 2022
Historique:
received: 30 04 2022
revised: 18 05 2022
accepted: 24 05 2022
entrez: 10 6 2022
pubmed: 11 6 2022
medline: 11 6 2022
Statut: epublish

Résumé

An experimental method exploiting the capacitive response of most materials is here revised. The procedure called the "Voltage Ramp Method" (VRM) is based on applying proper voltage ramp cycles over time and measuring electrical current intensity flowing through the material sample. In the case of an ideal capacitor, a current plateau should be easily measured, and the capacitance value precisely determined. However, most media, e.g., semiconductors and insulating polymers, show dielectric absorption and hence electric leakage effects. Therefore, the VRM method allows simultaneous determination of their equivalent capacitance and resistance. Some case studies are discussed as concerning the application of VRM to both standard and actual media. A figure of merit of the method is the percentage difference between 2.5% and 1.5% with respect to the nominal values of a commercial capacitor and resistor, respectively. The simulation modeling of the material electrical response is compared to the experimental data also on polymer nanocomposites suitable for energy harvesting.

Identifiants

pubmed: 35683125
pii: ma15113829
doi: 10.3390/ma15113829
pmc: PMC9181138
pii:
doi:

Types de publication

Journal Article

Langues

eng

Subventions

Organisme : Fondazione Cariplo and Regione Lombardia, Italy
ID : 2018-1715

Références

Front Cell Neurosci. 2016 Feb 02;10:10
pubmed: 26869882

Auteurs

Paolo Vitulo (P)

Dipartimento di Fisica, Università degli Studi di Pavia, Via A. Bassi 6, 27100 Pavia, Italy.

Michele Zanoletti (M)

Dipartimento di Fisica, Università degli Studi di Pavia, Via A. Bassi 6, 27100 Pavia, Italy.

Riccardo Morina (R)

Dipartimento di Scienza dei Materiali, Università Degli Studi di Milano Bicocca, Via R. Cozzi 55, 20125 Milano, Italy.

Daniele Callegari (D)

Dipartimento di Chimica, Università Degli Studi di Pavia, Via T. Taramelli 12, 27100 Pavia, Italy.

Eliana Quartarone (E)

Dipartimento di Chimica, Università Degli Studi di Pavia, Via T. Taramelli 12, 27100 Pavia, Italy.

Riccardo Viola (R)

Atom S.p.A., Via Morosini 6, 27029 Vigevano, Italy.

Davide Comoretto (D)

Dipartimento di Chimica e Chimica Industriale, Università Degli Studi di Genova, Via Dodecaneso 31, 16146 Genova, Italy.

Sergio Dulio (S)

Atom S.p.A., Via Morosini 6, 27029 Vigevano, Italy.

Piercarlo Mustarelli (P)

Dipartimento di Scienza dei Materiali, Università Degli Studi di Milano Bicocca, Via R. Cozzi 55, 20125 Milano, Italy.

Maddalena Patrini (M)

Dipartimento di Fisica, Università degli Studi di Pavia, Via A. Bassi 6, 27100 Pavia, Italy.

Classifications MeSH