Photoconductive focal plane array based on HgTe quantum dots for fast and cost-effective short-wave infrared imaging.


Journal

Nanoscale
ISSN: 2040-3372
Titre abrégé: Nanoscale
Pays: England
ID NLM: 101525249

Informations de publication

Date de publication:
07 Jul 2022
Historique:
pubmed: 22 6 2022
medline: 22 6 2022
entrez: 21 6 2022
Statut: epublish

Résumé

HgTe nanocrystals, thanks to quantum confinement, present a broadly tunable band gap all over the infrared spectral range. In addition, significant efforts have been dedicated to the design of infrared sensors with an absorbing layer made of nanocrystals. However, most efforts have been focused on single pixel sensors. Nanocrystals offer an appealing alternative to epitaxially grown semiconductors for infrared imaging by reducing the material growth cost and easing the coupling to the readout circuit. Here we propose a strategy to design an infrared focal plane array from a single fabrication step. The focal plane array (FPA) relies on a specifically designed readout circuit enabling in plane electric field application and operation in photoconductive mode. We demonstrate a VGA format focal plane array with a 15 μm pixel pitch presenting an external quantum efficiency of 4-5% (15% internal quantum efficiency) for a cut-off around 1.8 μm and operation using Peltier cooling only. The FPA is compatible with 200 fps imaging full frame and imaging up to 340 fps is demonstrated by driving a reduced area of the FPA. In the last part of the paper, we discuss the cost of such sensors and show that the latter is only driven by labor costs while we estimate the cost of the NC film to be in the 10-20 € range.

Identifiants

pubmed: 35726871
doi: 10.1039/d2nr01313d
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

9359-9368

Auteurs

Charlie Gréboval (C)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

David Darson (D)

Laboratoire de Physique de l'Ecole normale supérieure, ENS, Université PSL, CNRS, Sorbonne Université, Université Paris-Diderot, Sorbonne Paris Cité, Paris, France.

Victor Parahyba (V)

New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France.

Rodolphe Alchaar (R)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

Claire Abadie (C)

ONERA - The French Aerospace Lab, 6, chemin de la Vauve aux Granges, BP 80100, 91123 Palaiseau, France.

Vincent Noguier (V)

New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France.

Simon Ferré (S)

New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France.

Eva Izquierdo (E)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

Adrien Khalili (A)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

Yoann Prado (Y)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

Pierre Potet (P)

New Imaging Technologies SA, 1 impasse de la Noisette, 91370 Verrières le Buisson, France.

Emmanuel Lhuillier (E)

Sorbonne Université, CNRS, Institut des NanoSciences de Paris, INSP, F-75005 Paris, France. el@insp.upmc.fr.

Classifications MeSH