Deep Learning Network for Speckle De-Noising in Severe Conditions.
DnCNN
database controlled parameters
deep learning
digital holography
fine-tuning
image de-noising
Journal
Journal of imaging
ISSN: 2313-433X
Titre abrégé: J Imaging
Pays: Switzerland
ID NLM: 101698819
Informations de publication
Date de publication:
09 Jun 2022
09 Jun 2022
Historique:
received:
15
04
2022
revised:
23
05
2022
accepted:
31
05
2022
entrez:
23
6
2022
pubmed:
24
6
2022
medline:
24
6
2022
Statut:
epublish
Résumé
Digital holography is well adapted to measure any modifications related to any objects. The method refers to digital holographic interferometry where the phase change between two states of the object is of interest. However, the phase images are corrupted by the speckle decorrelation noise. In this paper, we address the question of de-noising in holographic interferometry when phase data are polluted with speckle noise. We present a new database of phase fringe images for the evaluation of de-noising algorithms in digital holography. In this database, the simulated phase maps present characteristics such as the size of the speckle grains and the noise level of the fringes, which can be controlled by the generation process. Deep neural network architectures are trained with sets of phase maps having differentiated parameters according to the features. The performances of the new models are evaluated with a set of test fringe patterns whose characteristics are representative of severe conditions in terms of input SNR and speckle grain size. For this, four metrics are considered, which are the PSNR, the phase error, the perceived quality index and the peak-to-valley ratio. Results demonstrate that the models trained with phase maps with a diversity of noise characteristics lead to improving their efficiency, their robustness and their generality on phase maps with severe noise.
Identifiants
pubmed: 35735964
pii: jimaging8060165
doi: 10.3390/jimaging8060165
pmc: PMC9225311
pii:
doi:
Types de publication
Journal Article
Langues
eng
Références
Opt Express. 2016 Dec 12;24(25):28713-28730
pubmed: 27958515
Opt Express. 2016 Jun 27;24(13):14322-43
pubmed: 27410587
Light Sci Appl. 2018 Aug 1;7:48
pubmed: 30839600
Opt Express. 2019 Feb 18;27(4):4927-4943
pubmed: 30876102
Opt Lett. 2018 Sep 1;43(17):4240-4243
pubmed: 30160761
Opt Express. 2021 Oct 25;29(22):36180-36200
pubmed: 34809036
J Opt Soc Am A Opt Image Sci Vis. 2018 Jan 1;35(1):A53-A60
pubmed: 29328085
J Opt Soc Am A Opt Image Sci Vis. 2022 Feb 1;39(2):A62-A78
pubmed: 35200959
Appl Opt. 2008 Oct 10;47(29):5408-19
pubmed: 18846183
IEEE Trans Image Process. 2017 Jul;26(7):3142-3155
pubmed: 28166495
Biomed Opt Express. 2018 Oct 02;9(11):5129-5146
pubmed: 30460118
Opt Express. 2020 Feb 17;28(4):5393-5409
pubmed: 32121761
Opt Express. 2021 May 10;29(10):14720-14735
pubmed: 33985188