Review of electrical stimulus methods of


Journal

Nanoscale
ISSN: 2040-3372
Titre abrégé: Nanoscale
Pays: England
ID NLM: 101525249

Informations de publication

Date de publication:
14 Jul 2022
Historique:
pubmed: 29 6 2022
medline: 29 6 2022
entrez: 28 6 2022
Statut: epublish

Résumé

Resistive random access memory (RRAM) devices have been demonstrated to be a promising solution for the implementation of a neuromorphic system with high-density synapses due to the simple device structure, nanoscale dimension, high switching speed, and low power consumption. Various electrical stimuli applied to RRAM devices could cause various working modes of the bionic synapses. The application of RRAM devices needs to understand the micromechanism of the resistive switching process, which is inseparable from advanced characterization techniques.

Identifiants

pubmed: 35762914
doi: 10.1039/d2nr01872a
doi:

Types de publication

Journal Article Review

Langues

eng

Sous-ensembles de citation

IM

Pagination

9542-9552

Auteurs

Yewei Zhang (Y)

In Situ Devices Center, School of Communication and Electronic Engineering, East China Normal University, Shanghai 200241, China. xwu@cee.ecnu.edu.cn.

Chaolun Wang (C)

In Situ Devices Center, School of Communication and Electronic Engineering, East China Normal University, Shanghai 200241, China. xwu@cee.ecnu.edu.cn.

Xing Wu (X)

In Situ Devices Center, School of Communication and Electronic Engineering, East China Normal University, Shanghai 200241, China. xwu@cee.ecnu.edu.cn.

Classifications MeSH