Synchronized time tagger for single-photon detection in one- and two-dimension quantum experiments.


Journal

The Review of scientific instruments
ISSN: 1089-7623
Titre abrégé: Rev Sci Instrum
Pays: United States
ID NLM: 0405571

Informations de publication

Date de publication:
01 Jun 2022
Historique:
entrez: 1 7 2022
pubmed: 2 7 2022
medline: 2 7 2022
Statut: ppublish

Résumé

We report a synchronized time tagger based on a field-programmable-gate-array chip for one- or two-dimensional quantum experiments that require precise single-photon detections. The time tagger has a 9.2 ps single-shot root-mean-square precision and is equipped with a 1 GB dynamic memory for data storage. Because the relationship between the control parameter and acquired data is guaranteed by using hardware synchronization, the experiment can be performed much faster than conventional schemes that are based on software synchronization. With this technique, an improvement of up to 61.3% in efficiency is observed in a typical nitrogen-vacancy center quantum experiment. We further show advanced optical features of the center using the detected high-resolution photon-arrival information and provide detailed electrical benchmarking of the device. This technique could be easily extended to other quantum control systems.

Identifiants

pubmed: 35778044
doi: 10.1063/5.0086943
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

063102

Auteurs

Runchuan Ye (R)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Xue Lin (X)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Feifei Zhou (F)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Yulin Dai (Y)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Qidi Hu (Q)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Xining Li (X)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Guangjun Xie (G)

School of Microelectronics, Hefei University of Technology, Hefei, Anhui 230009, China.

Nanyang Xu (N)

School of Physics, Hefei University of Technology, Hefei, Anhui 230009, China.

Classifications MeSH