The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias.
Au nanoparticle growth
Carbon
Formvar
Liquid TEM
Secondary electrons
Si(3)N(4)
Journal
Ultramicroscopy
ISSN: 1879-2723
Titre abrégé: Ultramicroscopy
Pays: Netherlands
ID NLM: 7513702
Informations de publication
Date de publication:
Oct 2022
Oct 2022
Historique:
received:
10
03
2022
revised:
17
06
2022
accepted:
21
06
2022
pubmed:
6
7
2022
medline:
6
7
2022
entrez:
5
7
2022
Statut:
ppublish
Résumé
The effect of window material on electron beam induced phenomena in liquid phase electron microscopy (LPEM) is an interesting yet under-explored subject. We have studied the differences of electron beam induced gold nanoparticle (AuNP) growth subject to three encapsulation materials: Silicon Nitride (Si
Identifiants
pubmed: 35780682
pii: S0304-3991(22)00109-7
doi: 10.1016/j.ultramic.2022.113579
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
113579Informations de copyright
Copyright © 2022. Published by Elsevier B.V.