Numerical calculation of near-field in vicinity of three-dimensional nano-optical probes using boundary element method.
Boundary element method
Near field optics
Near-field scanning optical microscopy
Optical probe
Journal
Micron (Oxford, England : 1993)
ISSN: 1878-4291
Titre abrégé: Micron
Pays: England
ID NLM: 9312850
Informations de publication
Date de publication:
Sep 2022
Sep 2022
Historique:
received:
25
04
2022
revised:
18
06
2022
accepted:
23
06
2022
pubmed:
9
7
2022
medline:
9
7
2022
entrez:
8
7
2022
Statut:
ppublish
Résumé
The diffraction limit is one of the main obstacles in the development of microscopes to analyze the morphology and structure of materials. The main idea of near field scanning optical microscopy (NSOM) is to overcome the diffraction limit using sub-wavelength apertures. In this work, the near-field is simulated in the vicinity of three-dimensional nano-optical apertureless probes. For this purpose, the Helmholtz equation is solved using the boundary element method (BEM). The effects of different parameters on the near field generated in the vicinity of the optical probe are studied. These parameters consist of the length and radius of the probe, the size of the aperture, the angle of the tapered tip, and the geometry of the probe tip. The main advantages of the proposed method are the high accuracy, the very short calculation time, and the ability to calculate the near field inside and outside the optical probe without any approximation.
Identifiants
pubmed: 35803205
pii: S0968-4328(22)00118-4
doi: 10.1016/j.micron.2022.103322
pii:
doi:
Types de publication
Journal Article
Langues
eng
Sous-ensembles de citation
IM
Pagination
103322Informations de copyright
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