Optimal acceleration voltage for near-atomic resolution imaging of layer-stacked 2D polymer thin films.


Journal

Nature communications
ISSN: 2041-1723
Titre abrégé: Nat Commun
Pays: England
ID NLM: 101528555

Informations de publication

Date de publication:
08 Jul 2022
Historique:
received: 14 12 2021
accepted: 29 06 2022
entrez: 8 7 2022
pubmed: 9 7 2022
medline: 9 7 2022
Statut: epublish

Résumé

Despite superb instrumental resolution in modern transmission electron microscopes (TEM), high-resolution imaging of organic two-dimensional (2D) materials is a formidable task. Here, we present that the appropriate selection of the incident electron energy plays a crucial role in reducing the gap between achievable resolution in the image and the instrumental limit. Among a broad range of electron acceleration voltages (300 kV, 200 kV, 120 kV, and 80 kV) tested, we found that the highest resolution in the HRTEM image is achieved at 120 kV, which is 1.9 Å. In two imine-based 2D polymer thin films, unexpected molecular interstitial defects were unraveled. Their structural nature is identified with the aid of quantum mechanical calculations. Furthermore, the increased image resolution and enhanced image contrast at 120 kV enabled the detection of functional groups at the pore interfaces. The experimental setup has also been employed for an amorphous organic 2D material.

Identifiants

pubmed: 35803950
doi: 10.1038/s41467-022-31688-4
pii: 10.1038/s41467-022-31688-4
pmc: PMC9270374
doi:

Types de publication

Journal Article

Langues

eng

Sous-ensembles de citation

IM

Pagination

3948

Subventions

Organisme : Deutsche Forschungsgemeinschaft (German Research Foundation)
ID : 492191310
Organisme : Deutsche Forschungsgemeinschaft (German Research Foundation)
ID : 417590517
Organisme : Deutsche Forschungsgemeinschaft (German Research Foundation)
ID : 426572620

Informations de copyright

© 2022. The Author(s).

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Auteurs

Baokun Liang (B)

Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science, Universität Ulm, 89081, Ulm, Germany.

Yingying Zhang (Y)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.

Christopher Leist (C)

Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science, Universität Ulm, 89081, Ulm, Germany.

Zhaowei Ou (Z)

Key Laboratory for Polymeric Composite and Functional Materials of Ministry of Education, School of Chemistry, and State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, 510275, Guangzhou, P. R. China.

Miroslav Položij (M)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.

Zhiyong Wang (Z)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.

David Mücke (D)

Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science, Universität Ulm, 89081, Ulm, Germany.

Renhao Dong (R)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.
Key Laboratory of Colloid and Interface Chemistry of the Ministry of Education, School of Chemistry and Chemical Engineering, Shandong University, 250100, Jinan, P. R. China.

Zhikun Zheng (Z)

Key Laboratory for Polymeric Composite and Functional Materials of Ministry of Education, School of Chemistry, and State Key Laboratory of Optoelectronic Materials and Technologies, Sun Yat-sen University, 510275, Guangzhou, P. R. China.

Thomas Heine (T)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.
Helmholtz Center Dresden-Rossendorf, Institute of Research Ecology, Leipzig Research Branch, 04318, Leipzig, Germany.
Department of Chemistry, Yonsei University, 03722, Seoul, Republic of Korea.

Xinliang Feng (X)

Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany.
Max Planck Institute of Microstructure Physics, 06120, Halle (Saale), Germany.

Ute Kaiser (U)

Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science, Universität Ulm, 89081, Ulm, Germany. ute.kaiser@uni-ulm.de.

Haoyuan Qi (H)

Central Facility for Electron Microscopy, Electron Microscopy Group of Materials Science, Universität Ulm, 89081, Ulm, Germany. haoyuan.qi@uni-ulm.de.
Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden (cfaed), Technische Universität Dresden, 01062, Dresden, Germany. haoyuan.qi@uni-ulm.de.

Classifications MeSH